InP- and GaAs-Based Plasmonic High-Electron-Mobility Transistors for Room-Temperature Ultrahigh-Sensitive Terahertz Sensing and Imaging

被引:68
|
作者
Watanabe, Takayuki [1 ]
Boubanga-Tombet, Stephane A. [2 ]
Tanimoto, Yudai [1 ]
Fateev, Denis [3 ]
Popov, Viacheslav [3 ]
Coquillat, Dominique [4 ]
Knap, Wojciech [4 ]
Meziani, Yahya M. [5 ]
Wang, Yuye [6 ]
Minamide, Hiroaki [6 ]
Ito, Hiromasa [6 ]
Otsuji, Taiichi [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, RIEC, Sendai, Miyagi 9808577, Japan
[3] Saratov NG Chernyshevskii State Univ, Russian Acad Sci, Kotelnikov Inst Radio Engn & Elect, Saratov 410019, Russia
[4] Univ Montpellier, CNRS, Lab LC2, F-34095 Montpellier, France
[5] Univ Salamanca, Dept Fis Aplicada, E-37008 Salamanca, Spain
[6] RIKEN, Adv Sci Inst, Sendai, Miyagi 9800845, Japan
基金
俄罗斯基础研究基金会;
关键词
Asymmetry; detection; high-electron-mobility transistor (HEMT); imaging; plasmon; sensing; terahertz;
D O I
10.1109/JSEN.2012.2225831
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reviews recent advances in the design and performance of our original InP- and GaAs-based plasmonic high-electron-mobility transistors (HEMTs) for ultrahighly-sensitive terahertz (THz) sensing and imaging. First, the fundamental theory of plasmonic THz detection is briefly described. Second, single-gate HEMTs with parasitic antennae are introduced as a basic core device structure, and their detection characteristics and sub-THz imaging potentialities are investigated. Third, dual-grating-gate (DGG)-HEMT structures are investigated for broadband highly sensitive detection of THz radiations, and the record sensitivity and the highly-sensitive THz imaging are demonstrated using the InP-based asymmetric DGG-HEMTs. Finally, the obtained results are summarized and future trends are addressed.
引用
收藏
页码:89 / 99
页数:11
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