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- [37] Micro-Raman spectroscopy as a complementary technique to high resolution X-ray diffraction for the characterization of Si1-xGex thin layers PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 12, NO 3, 2015, 12 (03): : 304 - 309
- [40] Photoluminescence and Raman spectroscopy characterization of highly c-axis oriented MgxZn1−xO thin films on Pt-coated silicon substrates Journal of Electroceramics, 2011, 27 : 162 - 168