Blocks and residual stresses in shaped sapphire single crystals

被引:4
作者
Krymov, V. M. [1 ]
Nosov, Yu. G. [1 ]
Bakholdin, S. I. [1 ]
Maslov, V. N. [1 ]
Shul'pina, I. L. [1 ]
Nikolaev, V. I. [1 ]
机构
[1] Russian Acad Sci, Ioffe Inst, Politekhnicheskaya Ul 26, St Petersburg 194021, Russia
关键词
Stresses; Defects; X-ray topography; Stepanov method; Edge defined film fed growth; Sapphire; STEPANOV METHOD; GROWTH; RIBBONS; MELT; RODS;
D O I
10.1016/j.jcrysgro.2016.08.017
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The formation of blocks and residual stresses in shaped sapphire crystals grown from the melt by the Stepanov method (EFG) has been studied. The probability of block formation is higher for the growth along the c axis compared to that grown in the a-axis direction. The distribution of residual stress in sapphire crystals of tubular, rectangular and round cross section was measured by the conoscopy method. It was found that the magnitude of the residual stress increases from the center to the periphery of the crystal and reaches up to about 20 MPa. Residual stress tensor components for solid round rod and tubular single crystals were determined by numerical integration. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:314 / 319
页数:6
相关论文
共 20 条
  • [1] Modern trends in crystal growth and new applications of sapphire
    Akselrod, Mark S.
    Bruni, Frank J.
    [J]. JOURNAL OF CRYSTAL GROWTH, 2012, 360 : 134 - 145
  • [2] Antonov P.I., 2004, B RUSS ACAD SCI PHYS, V68, P880
  • [3] FORMATION OF DISLOCATION-STRUCTURE IN SHAPED SINGLE-CRYSTALS DURING THEIR GROWTH FROM THE MELT BY STEPANOV METHOD
    ANTONOV, PI
    BAKHOLDIN, SI
    KRYMOV, VM
    NIKANOROV, SP
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 1984, 19 (06) : 769 - 780
  • [4] Residual stress and dislocations density in silicon ribbons grown via optical zone melting
    Augusto, A.
    Pera, D.
    Choi, H. J.
    Bellanger, P.
    Brito, M. C.
    Maia Alves, J.
    Vallera, A. M.
    Buonassisi, T.
    Serra, J. M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 113 (08)
  • [5] The Influence of Thermal Screens on the Temperature Distribution, Thermal Stress, and Defect Structure during Growth of Shaped Sapphire Crystals
    Bakholdin, S. I.
    Krymov, V. M.
    Nosov, Yu. G.
    Shul'pina, I. L.
    Denisov, A. V.
    Sallum, M. I.
    Vasil'ev, M. G.
    Mamedov, V. M.
    Yuferev, V. S.
    [J]. CRYSTALLOGRAPHY REPORTS, 2010, 55 (04) : 703 - 709
  • [6] Measurement of residual stress in EFG ribbons using a phase-shifting IR photoelastic method
    Brito, MC
    Alves, JM
    Serra, JM
    Gamboa, RM
    Pinto, C
    Vallera, AM
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2005, 87 (1-4) : 311 - 316
  • [7] On the void distribution and size in shaped sapphire crystals
    Bunoiu, OM
    Nicoara, I
    Santailler, JL
    Theodore, F
    Duffar, T
    [J]. CRYSTAL RESEARCH AND TECHNOLOGY, 2005, 40 (09) : 852 - 859
  • [8] Optical anomalies and residual stresses in basal-plane-faceted ribbons of Stepanov-grown sapphire crystals
    Denisov, A. V.
    Krymov, V. M.
    Punin, Yu O.
    [J]. PHYSICS OF THE SOLID STATE, 2007, 49 (03) : 472 - 477
  • [9] Dobrovinskaya ER, 2009, MICRO- OPTO-ELECTRON, P1, DOI 10.1007/978-0-387-85695-7_1
  • [10] SILICON RIBBON GROWTH VIA RIBBON-TO-RIBBON (RTR) TECHNIQUE - PROCESS UPDATE AND MATERIAL CHARACTERIZATION
    GURTLER, RW
    BAGHDADI, A
    ELLIS, RJ
    LESK, IA
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1978, 7 (03) : 441 - 477