Eddy current testing for small depth flaw

被引:0
作者
Xiao, CS [1 ]
Wang, SZ [1 ]
Zhu, HB [1 ]
机构
[1] Navy Univ Engn, Inst Applicat Study Modern Technol Naval Weap, Wuhan 430033, Hubei, Peoples R China
来源
PROGRESS IN SAFETY SCIENCE AND TECHNOLOGY, VOL V, PTS A AND B | 2005年 / 5卷
关键词
eddy-current testing; small depth flaw; perturbation field; analytic method;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper presents an analytic method for the magnetic field distributions and the impedance change in eddy current testing when the conductor surface contains a small depth flaw. Neglecting the effect of the flaw flank on the perturbation field and by using of the Taylor series, the perturbation problem can be translated into incidence field problem. Formulas are educed for the calculation of the perturbation field and impedance change. At last, square, round and rhombic flaw have been computed, their impedance change are plotted for comparison.
引用
收藏
页码:1670 / 1675
页数:6
相关论文
共 10 条