X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution

被引：262

作者：

Holler, M. ^{[1
]}

Diaz, A. ^{[1
]}

Guizar-Sicairos, M. ^{[1
]}

Karvinen, P. ^{[1
]}

Farm, Elina ^{[2
]}

Harkonen, Emma ^{[2
]}

Ritala, Mikko ^{[2
]}

Menzel, A. ^{[1
]}

Raabe, J. ^{[1
]}

Bunk, O. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Univ Helsinki, Dept Chem, FI-00014 Helsinki, Finland

来源：

SCIENTIFIC REPORTS | 2014年 / 4卷

基金：

芬兰科学院; 瑞士国家科学基金会;

关键词：

PHASE RETRIEVAL; PILATUS;

D O I：

10.1038/srep03857

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

X-ray ptychography is a scanning variant of coherent diffractive imaging with the ability to image large fields of view at high resolution. It further allows imaging of non-isolated specimens and can produce quantitative mapping of the electron density distribution in 3D when combined with computed tomography. The method does not require imaging lenses, which makes it dose efficient and suitable to multi-keV X-rays, where efficient photon counting, pixelated detectors are available. Here we present the first highly resolved quantitative X-ray ptychographic tomography of an extended object yielding 16 nm isotropic 3D resolution recorded at 2 angstrom wavelength. This first-of-its-kind demonstration paves the way for ptychographic X-ray tomography to become a promising method for X-ray imaging of representative sample volumes at unmatched resolution, opening tremendous potential for characterizing samples in materials science and biology by filling the resolution gap between electron microscopy and other X-ray imaging techniques.

引用

页数：5

共 32 条

[1]

[Anonymous], FD122 ERM BAM FED I

[2] High-resolution ab initio three-dimensional x-ray diffraction microscopy [J].