Detecting fingerprint minutiae by run length encoding scheme

被引:10
作者
Shin, JH [1 ]
Hwang, HY
Chien, SI
机构
[1] Kyungpook Natl Univ, Sch Elect & Elect Engn, Taejon 702701, South Korea
[2] Samsung Elect Co Ltd, Suwon, South Korea
关键词
fingerprint; minutiae; feature extraction; minutiae extraction; run length encoding;
D O I
10.1016/j.patcog.2005.12.013
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Many approaches to minutiae extraction have already been proposed for automatic fingerprint matching, and most transform fingerprint images into binary images through state-of-the-art algorithms and submit the binary image to a thinning process. However, this paper proposes an original technique for extracting minutiae based on representing the ridge structure of a fingerprint image as a run length code (RLC). The essential idea is to detect minutiae by searching for the termination points or bifurcation points of ridges in the RLC, rather than in a fingerprint image. Experimental results and a comparative analysis show that the proposed method is fairly reliable and faster than a conventional thinning-based method. (c) 2006 Pattern Recognition Society. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:1140 / 1154
页数:15
相关论文
共 33 条
  • [1] Almansa A, 2000, IEEE T IMAGE PROCESS, V9, P2027, DOI 10.1109/83.887971
  • [2] Bhanu B, 2001, PROC CVPR IEEE, P591
  • [3] BOLLE RM, 2002, LECT NOTES COMPUTER, V2338, P58
  • [4] A MODIFIED FAST PARALLEL ALGORITHM FOR THINNING DIGITAL PATTERNS
    CHEN, YS
    HSU, WH
    [J]. PATTERN RECOGNITION LETTERS, 1988, 7 (02) : 99 - 106
  • [5] DALE L, 2001, BIOMETRIC TECHNOLOGY, V9, P7
  • [6] Fingerprints thinning algorithm
    Espinosa-Duró, V
    [J]. IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE, 2003, 18 (09) : 28 - 30
  • [7] Espinosa-Duró V, 2002, 36TH ANNUAL 2002 INTERNATIONAL CARNAHAN CONFERENCE ON SECURITY TECHNOLOGY, PROCEEDINGS, P43
  • [8] Fingerprint minutiae extraction from skeletonized binary images
    Farina, A
    Kovács-Vajna, ZM
    Leone, A
    [J]. PATTERN RECOGNITION, 1999, 32 (05) : 877 - 889
  • [9] Fitz A. P., 1995, European Convention on Security and Detection (Conf. Publ. No.408), P257, DOI 10.1049/cp:19950508
  • [10] A PATTERN ADAPTIVE THINNING ALGORITHM
    GOVINDAN, VK
    SHIVAPRASAD, AP
    [J]. PATTERN RECOGNITION, 1987, 20 (06) : 623 - 637