Kinetics of electron-beam dispersion of fullerite C60

被引:2
作者
Razanau, Ihar [1 ]
Mieno, Tetsu [2 ]
Kazachenko, Victor [1 ]
机构
[1] Belarusian State Univ Transport, Dept Mat Sci & Technol, Gomel 246653, BELARUS
[2] Shizuoka Univ, Dept Phys, Shizuoka 4228529, Japan
关键词
Fullerene; C-60; Electron-beam dispersion; Kinetics; Thin film; Deposition; POLYMERIZED PHASES; FILMS; DEPOLYMERIZATION; FULLERENES; MECHANISMS; INJECTION;
D O I
10.1016/j.nimb.2012.03.015
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Electron-beam dispersion of pressed fullerite C-60 targets in vacuum leads to the deposition of thin films containing polymeric forms of C-60. The aim of the present report is to analyze physical-chemical processes in the fullerite target during its electron-beam dispersion through the analysis of the kinetics of the radiation temperature of the target surface, the coating growth rate and the density of negative current on the substrate. It was shown that the induction stage of the process is determined by the negative charging and radiation-induced modification and heating of the target. The transitional stage is characterized by nonstationary sublimation of the target material through the pores in the modified surface layer and release of the accumulated negative charge. Stabilization of the process parameters owing to the convection cooling of the target by the sublimation products and the decrease in the pressure inside the microcavities beneath the pores leads to a quasi-stationary stage of target sublimation and deposition of a coating containing polymeric forms of C-60. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:117 / 122
页数:6
相关论文
共 28 条
[1]   Classical dielectric models of fullerenes and estimation of heat radiation [J].
Andersen, JU ;
Bonderup, E .
EUROPEAN PHYSICAL JOURNAL D, 2000, 11 (03) :413-434
[2]   Isothermal and polythermal kinetics of depolymerization of C60 polymers [J].
Bogachev, AG ;
Korobov, MV ;
Senyavin, VM ;
Davydov, VA ;
Rakhmanina, AV .
THERMOCHIMICA ACTA, 2006, 444 (01) :91-96
[3]   Electron-stimulated fragmentation mechanism for fullerene films on Si(111)-(7x7) surfaces: Dependence on thickness and electron flux [J].
Bolotov, L ;
Kanayama, T .
PHYSICAL REVIEW B, 2003, 68 (03)
[4]   Semiclassical calculations of the cross section for electron-impact ionization of C-60 [J].
Deutsch, H ;
Becker, K ;
Pittner, J ;
BonacicKoutecky, V ;
Matt, S ;
Mark, TD .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1996, 29 (21) :5175-5181
[5]   Thin-film deposition of polymers by vacuum degradation [J].
Gritsenko, KP ;
Krasovsky, AM .
CHEMICAL REVIEWS, 2003, 103 (09) :3607-3649
[6]   In situ Fourier-transform infrared study of electron-irradiation-induced reaction in a C60 film [J].
Hara, T ;
Onoe, J ;
Tanaka, H ;
Li, YZ ;
Takeuchi, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (4A) :1872-1876
[7]   Electron-beam-induced fragmentation in ultrathin C60 films on Si(100)-2x1-H:: Mechanisms of cage destruction [J].
Hunt, MRC ;
Schmidt, J ;
Palmer, RE .
PHYSICAL REVIEW B, 1999, 60 (08) :5927-5937
[8]  
JOY DC, 1995, SCANNING, V17, P270, DOI 10.1002/sca.4950170501
[9]   PENETRATION AND ENERGY-LOSS THEORY OF ELECTRONS IN SOLID TARGETS [J].
KANAYA, K ;
OKAYAMA, S .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (01) :43-&
[10]   The structure of coatings deposited by electron beam dispersion of fullerrite C60 [J].
Kazachenko, V. P. ;
Ryazanov, I. V. .
TECHNICAL PHYSICS LETTERS, 2008, 34 (11) :930-933