Improved calculation of the backscattering factor for quantitative analysis by Auger electron spectroscopy

被引:13
作者
Ding, Z. J. [1 ]
Tan, W. S.
Li, Y. G.
机构
[1] Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Anhui, Peoples R China
[2] Univ Sci & Technol China, Dept Phys, Hefei 230026, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
D O I
10.1063/1.2189928
中图分类号
O59 [应用物理学];
学科分类号
摘要
Based on a Monte Carlo simulation method, an improved calculation of the backscattering factor in quantitative analysis by Auger electron spectroscopy has been performed by integrating several aspects of recent progresses in the related fields. The calculation used a general definition of backscattering factor, more accurate ionization cross section, up-to-date Monte Carlo model of electron inelastic scattering, and a large number of electron trajectories to ensure less statistical error. The results reveal several noticeable properties of backscattering factor, i.e., its slow variation with primary energy at higher overvoltage ratios, and dependence on the geometrical configuration of a detector. However, only for large emission angles of Auger signals a considerable angular dependence of backscattering factor is found. Specifically a calculation is carried out for detection in the solid angles of a cylindrical mirror analyzer. This backscattering factor can be less than unity for very low primary energies closing to ionization energy and/or for large incident angles. The physical cause has been detailed and analyzed. (C) 2006 American Institute of Physics.
引用
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页数:12
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