STEM_CELL: A software tool for electron microscopy: Part I-simulations

被引：94

作者：

Grillo, Vincenzo ^{[1
,2
]}

Rotunno, Enzo ^{[2
]}

机构：

[1] CNR, NANO S3, I-41125 Modena, Italy

[2] CNR IMEM Inst, I-43124 Parma, Italy

来源：

ULTRAMICROSCOPY | 2013年 / 125卷

关键词：

Electron microscopy simulation; STEM-ADF; Crystallographic modeling; Channeling; STRESS-RELAXATION; IMAGE SIMULATION; STRAIN FIELDS; CONTRAST; INFORMATION; DIFFRACTION; ABERRATION; SCATTERING; DISLOCATIONS;

D O I：

10.1016/j.ultramic.2012.10.016

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The software STEM_CELL, here presented, is a useful tool for (S) TEM simulation. In particular innovative solutions are presented in (1) the supercell manipulation and parameters setting (2) simulation execution through the modified Kirkland routines (3) simulation post-processing with extended output and comprehensive graphic tools (4) image contrast interpretation through a strain channeling equation accounting for strain effects in STEM-ADF. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：97 / 111

页数：15

共 65 条

[51]

Robertson M. D., 2006, MICROSCOPY MICROA S2, V12, P714

[52]

Rosenauer A., 2007, P PHYS, V120, P169

[53]

Rotunno E., CRYSTAL STR IN PRESS

[54] Measurement method of aberration from Ronchigram by autocorrelation function [J].

Sawada, H. ;

Sannomiya, T. ;

Hosokawa, F. ;

Nakamichi, T. ;

Kaneyama, T. ;

Tomita, T. ;

Kondo, Y. ;

Tanaka, T. ;

Oshima, Y. ;

Tanishiro, Y. ;

Takayanagi, K. .

ULTRAMICROSCOPY, 2008, 108 (11) :1467-1475

[55] PRACTICAL COMPUTATION OF AMPLITUDES AND PHASES IN ELECTRON-DIFFRACTION [J].

SELF, PG ;

OKEEFE, MA ;

BUSECK, PR ;

SPARGO, AEC .

ULTRAMICROSCOPY, 1983, 11 (01) :35-52

[56] EMS - A SOFTWARE PACKAGE FOR ELECTRON-DIFFRACTION ANALYSIS AND HREM IMAGE SIMULATION IN MATERIALS SCIENCE [J].

STADELMANN, PA .

ULTRAMICROSCOPY, 1987, 21 (02) :131-145

[57]

Teukolsky S.A., 1992, NUMERICAL RECIPIES C

[58] Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures [J].

Tillmann, K ;

Lentzen, M ;

Rosenfeld, R .

ULTRAMICROSCOPY, 2000, 83 (1-2) :111-128

[59] Is the frozen phonon model adequate to describe inelastic phonon scattering? [J].

Van Dyck, D. .

ULTRAMICROSCOPY, 2009, 109 (06) :677-682

[60] THE REAL SPACE METHOD FOR DYNAMICAL ELECTRON-DIFFRACTION CALCULATIONS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY .1. PRINCIPLES OF THE METHOD [J].

VANDYCK, D ;

COENE, W .

ULTRAMICROSCOPY, 1984, 15 (1-2) :29-40

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