STEM_CELL: A software tool for electron microscopy: Part I-simulations

被引：93
作者：
Grillo, Vincenzo [1 ,2 ]
Rotunno, Enzo [2 ]
机构：
[1] CNR, NANO S3, I-41125 Modena, Italy
[2] CNR IMEM Inst, I-43124 Parma, Italy
来源：
ULTRAMICROSCOPY | 2013年 / 125卷
关键词：
Electron microscopy simulation; STEM-ADF; Crystallographic modeling; Channeling; STRESS-RELAXATION; IMAGE SIMULATION; STRAIN FIELDS; CONTRAST; INFORMATION; DIFFRACTION; ABERRATION; SCATTERING; DISLOCATIONS;
D O I：
10.1016/j.ultramic.2012.10.016
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The software STEM_CELL, here presented, is a useful tool for (S) TEM simulation. In particular innovative solutions are presented in (1) the supercell manipulation and parameters setting (2) simulation execution through the modified Kirkland routines (3) simulation post-processing with extended output and comprehensive graphic tools (4) image contrast interpretation through a strain channeling equation accounting for strain effects in STEM-ADF. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：97 / 111
页数：15
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