Correlating Role of Substrate and Modified Physical Properties of (Bi0.5La0.5FeO3)1-x-(Ba0.7Sr0.3TiO3)x(x=0, 0.5) Thin Films

Bi(0.5)La(0.5)FeO(3)and its solid solution with 50% Ba(0.7)Sr(0.3)TiO(3)doping [(Bi0.5La0.5FeO3)(0.5)-(Ba0.7Sr0.3TiO3)(0.5)] were deposited on MgO and Si substrates by employing pulse laser deposition; these samples were investigated by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), electron dispersive study, infrared (IR) spectroscopy and magnetization measurement. XRD data confirms the formation of the sample in the thin film form. The average grain size was calculated from the XRD data, and the estimation of the microstrain was made by employing Williamson-Hall (W-H) formulation. The estimation of the grain size was confirmed by the FESEM images. The modifications in the IR absorption spectra and the room temperature magnetization due to differing substrates are correlated with the microstrain in thin film. The modification in the physical property offers the opportunity of optimizing the properties by selecting the substrate for potential technological application.