Simultaneous dual-band ultra-high resolution full-field optical coherence tomography

被引：48

作者：

Sacchet, Delphine ^{[1
]}

Moreau, Julien ^{[1
]}

Georges, Patrick ^{[1
]}

Dubois, Arnaud ^{[1
]}

机构：

[1] Univ Paris Sud, CNRS, UMR 8501, Inst Opt,Lab Charles Fabry, F-91127 Palaiseau, France

来源：

OPTICS EXPRESS | 2008年 / 16卷 / 24期

关键词：

Optical tomography - Silicon detectors - Gallium arsenide - Gallium alloys - Semiconductor alloys - III-V semiconductors - Semiconducting indium gallium arsenide - Image enhancement - Indium alloys;

D O I：

10.1364/OE.16.019434

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Ultrahigh-resolution full-field optical coherence tomography (FF-OCT) is demonstrated in the 800 nm and 1200 nm wavelength regions simultaneously using a Silicon-based (Si) CCD camera and an Indium Gallium Arsenide (InGaAs) camera as area detectors and a halogen lamp as illumination source. The FF-OCT setup is optimized to support the two broad spectral bands in parallel, achieving a detection sensitivity of similar to 90 dB and a micrometer-scale resolution in the three directions. Images of ex vivo biological tissues are presented (rabbit trachea and Xenopus laevis tadpole) with an increase in penetration depth at 1200 nm. A color image representation is applied to fuse both images and enhance spectroscopic property visualization.

引用

页码：19434 / 19446

页数：13

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