AN ULTRA LOW-VOLTAGE/POWER-EFFICIENT ALL-DIGITAL DELAY LOCKED LOOP IN 55 nm CMOS TECHNOLOGY

被引:3
作者
Cheng, Chun-Yuan [1 ]
Wang, Jinn-Shyan
Yeh, Cheng-Tai
机构
[1] Natl Chung Cheng Univ, Dept EE, Chiayi 621, Taiwan
关键词
ADDLL; low voltage; fast locking; power-efficient;
D O I
10.1142/S0218126612400257
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents an all-digital delay locked loop (ADDLL) that uses asynchronous-deskewing technology and achieves low power/voltage, small jitter, fast locking, and high process, voltage, and temperature (PVT)-variation tolerance. The measurement results show that the maximum frequency is 100 MHz at 0.35 V with 19 mu W power dissipation, 62 ps peak-to-peak jitter, and 3 locking cycles. When operated at 0.5 V, the measured maximal operating clock frequency is 450 MHz with 12 ps peak-to-peak jitter, 6 locking cycles and 119 mu W power dissipation. The ADDLL is fabricated with 55 nm CMOS technology, and the active area is only 0.019 mm(2).
引用
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页数:14
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