Optical properties of Sr3NbGa3Si2O14 crystal

被引：1

作者：

Wu, Shiliang ^{[1
]}

Lian, Jie ^{[1
]}

Song, Ping ^{[1
]}

Gao, Shang ^{[1
]}

Wang, Xiao ^{[1
]}

Ma, Zheng ^{[1
]}

Wang, Yingshun ^{[1
]}

Guan, Wenli ^{[2
]}

机构：

[1] Shandong Univ, Sch Informat Sci & Engn, Jinan 250100, Shandong, Peoples R China

[2] Qilu Normal Univ, Dept Phys, Jinan 250013, Shandong, Peoples R China

来源：

OPTIK | 2013年 / 124卷 / 08期

关键词：

Crystal growth; Optical materials and properties; Spectroscopic ellipsometry; GROWTH; ELLIPSOMETRY;

D O I：

10.1016/j.ijleo.2012.01.047

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Single crystal of Sr3NbGa3Si2O14 was successfully grown using the conventional Czochralski technique. UV-VIS-NIR spectrometry and spectroscopic ellipsometry have been used to study the optical properties of SNGS crystal. From the transmission spectrum, the cut-off wavelength is determined to be 284 nm. Refractive indices of SNGS crystal were accurately determined in the wavelength region between 350nm and 800 nm, based on the analysis of the transmission spectrum and SE measurements at multiple angles of incidence. The effects of varied values of k on n(o) and n(e) were also discussed. Furthermore, the phase matching angle of SNGS crystal is 39.00. (C) 2012 Elsevier GmbH. All rights reserved.

引用

页码：686 / 688

页数：3

共 16 条

[1] Generalized ellipsometry for the characterization of anisotropic materials:: influence of the sample adjustment on the extracted optical indices [J].

Boher, P ;

Piel, JP ;

Sacépé, B .

THIN SOLID FILMS, 2004, 455 :581-585

[2] Growth habits and characterization of Sr3NbGa3Si2O14 crystal [J].

Chen, Jianjun ;

Shi, Erwei ;

Zheng, Yanqing ;

Kong, Haikuan ;

Chen, Hui .

JOURNAL OF CRYSTAL GROWTH, 2006, 292 (02) :404-407

[3]

Collins R., 2005, Handbook of Ellipsometry, DOI DOI 10.1007/3-540-27488-X

[4]

JIN G F, 1998, LASER METROLOGY

[5] Growth and structure of A3NbGa3Si2O14 (A=Sr, Ca) compounds [J].

Jung, IH ;

Yoshikawa, A ;

Fukuda, T ;

Auh, KH .

JOURNAL OF ALLOYS AND COMPOUNDS, 2002, 339 (1-2) :149-155

[6] ELLIPSOMETRIC DETERMINATION OF OPTICAL ANISOTROPY OF GALLIUM SELENIDE [J].

MEYER, F ;

KLUIZENA.EE ;

ENGELSEN, DD .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (05) :529-532

[7] Spectroscopic ellipsometry measurements on an anisotropic organic crystal: potassium acid phthalate [J].

Sassella, A ;

Tubino, R ;

Borghesi, A ;

Giardini, ME ;

Quadrelli, L .

THIN SOLID FILMS, 1998, 313 :347-350

[8]

SHEN XC, 1992, OPTICAL PROPERTIES S

[9]

Shi X., 2007, THESIS SHANDONG U CH

[10] Coherent and incoherent interference modelling and measurement of anisotropic multilayer stacks using conventional ellipsometry [J].

Touir, H ;

Stchakovsky, M ;

Ossikovski, R ;

Warenghemb, M .

THIN SOLID FILMS, 2004, 455 :628-631

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