Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity

被引:40
作者
Guizar-Sicairos, Manuel [1 ]
Fienup, James R. [1 ]
机构
[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
来源
OPTICS EXPRESS | 2009年 / 17卷 / 04期
关键词
DIFFRACTION MICROSCOPY; IMAGE-RECONSTRUCTION; FOURIER-TRANSFORM; HOLOGRAPHY; ILLUMINATION; ALGORITHMS; CONSTRAINT; MODULUS; OBJECT;
D O I
10.1364/OE.17.002670
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe a method for characterizing focused x-ray beams using phase retrieval, with diversity achieved by transversely translating a phase-shifting or absorbing structure close to the beam focus. The required measurements can be taken with an experimental setup that is similar to that already used for fluorescent scan testing. The far-field intensity pattern is measured for each position of the translating structure, and the collected measurements are jointly used to estimate the beam profile by using a nonlinear optimization gradient search algorithm. The capability to reconstruct 1D and 2D beam foci is demonstrated through numerical simulations. (C) 2009 Optical Society of America
引用
收藏
页码:2670 / 2685
页数:16
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