Thick-film resistors with low and high TCRs on LTCC substrates

被引:0
作者
Hrovat, M
Belavic, D
Kita, J
Holc, J
Cilensek, J
Golonka, L
Dziedzic, A
机构
[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia
[2] HIPOT R&D, SI-8310 Sentjernej, Slovenia
[3] Univ Wroclaw Technol, PL-50370 Wroclaw, Poland
来源
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS | 2005年 / 35卷 / 03期
关键词
thick-film; resistors; NTC; LTCC; interactions; electrical parameters;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low-Temperature Co-fired Ceramic (LTCC) materials, which are sintered at the low temperatures typically used for thick-film processing, i.e., around 850 degrees C, are widely used for ceramic multi-chip modules (MCM-C). Thick-film resistors with low TCRs (Du Pont, 2041, nominal sheet resistivity 10 kohm/sq.) and thick-film NTC thermistors with high negative TCRs (EMCA-Remex, 4993, nominal resistivity 1 kohm/sq.) which were developed for alumina substrates, were evaluated on glassy LTCC substrates, The electrical and microstrutural characteristics of films fired on alumina or co-fired on "green" LTCC substrates were compared, The electrical characteristics (TCRs, sheet resistivities and noise indices) of 2041 resistors fired on both substrates are similar indicating that the resistors are compatible with the LTCC material. In the case of the NTC 4993 thermistors; the resistivities, beta factors and noise indices of the thermistors fired on LTCC substrates significantly increased, indicating the interactions between the thermistor layers and the LTCC substrates. The changes in the electrical parameters were attributed to the diffusion of a silica-rich phase from the LTCC into the thermistor films.
引用
收藏
页码:114 / 121
页数:8
相关论文
共 27 条
[1]  
[Anonymous], P 2000 INT S MICR IM
[2]  
Belavic D, 2003, INFORM MIDEM, V33, P45
[3]   Preparation and characterization of spinel-type Mn Ni Co O negative temperature coefficient ceramic thermistors [J].
De Vidales, JLM ;
Garcia-Chain, P ;
Rojas, RM ;
Vila, E ;
Garcia-Martinez, O .
JOURNAL OF MATERIALS SCIENCE, 1998, 33 (06) :1491-1496
[4]  
DOTY RE, 1995, P 1995 INT S MICR IS, P468
[5]   Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors [J].
Dziedzic, A ;
Golonka, LJ ;
Kita, J ;
Thust, H ;
Drue, KH ;
Bauer, R ;
Rebenklau, L ;
Wolter, KJ .
MICROELECTRONICS RELIABILITY, 2001, 41 (05) :669-676
[6]  
HAO YD, 1993, SENSOR ACTUAT A-PHYS, V35, P269, DOI 10.1016/0924-4247(93)80167-F
[7]  
His C. S., 2002, MATER CHEM PHYS, V78, P67
[8]   Characterization of PZT thick films fired on LTCC substrates [J].
Hrovat, M ;
Holc, J ;
Drnovsek, S ;
Belavic, D ;
Bernard, J ;
Kosec, M ;
Golonka, L ;
Dziedzic, A ;
Kita, J .
JOURNAL OF MATERIALS SCIENCE LETTERS, 2003, 22 (17) :1193-1195
[9]   The influence of firing temperature on the electrical and microstructural characteristics of thick-film resistors for strain gauge applications [J].
Hrovat, M ;
Bencan, A ;
Belavic, D ;
Holc, J ;
Drazic, G .
SENSORS AND ACTUATORS A-PHYSICAL, 2003, 103 (03) :341-352
[10]   A characterisation of thick film resistors for strain gauge applications [J].
Hrovat, M ;
Belavic, D ;
Samardzija, Z ;
Holc, J .
JOURNAL OF MATERIALS SCIENCE, 2001, 36 (11) :2679-2689