Online calibration of a Nyquist-rate analog-to-digital converter using output code-density histograms

被引：18

作者：

Eduri, U ^{[1
]}

Maloberti, F

机构：

[1] Univ Texas, Dept Elect Engn, Richardson, TX 75083 USA

[2] Univ Texas, Dept Elect Engn, Richardson, TX 75083 USA

[3] Univ Pavia, Dept Elect Engn, I-27100 Pavia, Italy

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2004年 / 51卷 / 01期

关键词：

analog-to-digital converter (ADC); code density; online calibration; static nonlinearity;

D O I：

10.1109/TCSI.2003.821279

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A scheme for the online correction of static nonlinearities in a Nyquist-rate analog-to-digital converter (ADC), using output code-density histograms, is presented. The estimation of the integral nonlinearity (INL) at each output level, followed by the creation of a corresponding entry in the look-up table for error correction, is analytically explained. The suitability of the scheme for calibrating high-end ADCs has been demonstrated. An extra ADC and the associated switching and postprocessing DSP circuitry along with some memory for storing the data to be processed, are the overhead in this scheme. An improvement of over 20 dB in the spurious-free dynamic range, from an uncalibrated value of over 80 dB, has been achieved.

引用

页码：15 / 24

页数：10

共 12 条

[1] Towards an ADC BIST scheme using the histogram test technique
Azaïs, F
Bernard, S
Bertrand, Y
Renovell, M
[J]. IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS, 2000, : 53 - 58
[2] Digital background calibration of an algorithmic analog-to-digital converter using a simplified queue
Blecker, EB
McDonald, TM
Erdogan, OE
Hurst, PJ
Lewis, SH
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2003, 38 (06) : 1059 - 1062
[3] Capofreddi PD, 1995, PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995, P54, DOI 10.1109/TEST.1995.529817
[4] The use of linear models in A/D converter testing
Capofreddi, PD
Wooley, BA
[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 1997, 44 (12) : 1105 - 1113
[5] The efficiency of methods for measuring A D converter linearity
Capofreddi, PD
Wooley, BA
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (03) : 763 - 769
[6] FULL-SPEED TESTING OF A/D CONVERTERS
DOERNBERG, J
LEE, HS
HODGES, DA
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1984, 19 (06) : 820 - 827
[7] EDURI U, 2001, P ICECS, V2, P837
[8] GATTI U, 1998, P ISCAS, V1, P17
[9] GU Z, P ISCAS 94 MAY JUN 3, V5, P457
[10] LIBERALI V, 1996, P INT MIX SIGN TEST, P113

← 1 2 →