Bending strain effects on the critical current in Cu-stabilized IBAD/EDDC processed SmBCO coated conductor tape

被引:9
作者
Shin, H. S. [1 ]
Dizon, J. R. C. [1 ]
Bonifacio, R. [1 ]
Kim, T. H. [2 ]
Ha, H. S. [2 ]
Kim, H. S. [2 ]
Oh, S. S. [2 ]
机构
[1] Andong Natl Univ, Sch Mech Engn, Andong 760749, Kyungbuk, South Korea
[2] Korea Electrotechnol Res Inst, Chang Won, South Korea
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2008年 / 468卷 / 15-20期
关键词
SmBCO; coated conductor; critical current; bending strain; IBAD/EDDC; stabilizer;
D O I
10.1016/j.physc.2008.05.238
中图分类号
O59 [应用物理学];
学科分类号
摘要
influences of bending strain on the critical current, I-c, in Cu-stabilized IBAD/EDDC processed SmBCO coated conductor (CC) tapes were investigated at 77 K and self-field using a small-scale Goldacker type bending test rig. Considering the location of the superconducting layer against the neutral axis, tensile and compressive bending strains were applied to the SmBCO coating layer and the strain effect on I-c degradation was discussed. Under tensile bending strain, the I-c decreased monotonically but recovered reversibly up to the irreversible strain limit. Under compressive bending strain, however, the Ic increased but in some cases it suddenly dropped after straightening due to the delarnination of the copper stabilizer. Also, repeated bending strains were applied to Cu-stabilized SmBCO CC samples in order to observe the behavior of I-c under cyclic loading. I-c Initially decreased with the application of 0.7% bending strain, but when the tape was Subjected to repeated bending up to 100 cycles, no more degradation occurred. And finally, the I-c almost recovered to I-co when the tape was straightened. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1702 / 1705
页数:4
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