Scanning tunneling microscopy of surface structures of InAs layers on GaAs (001) substrates

被引：0
|
作者：
Ikoma, N [1 ]
Ohkouchi, S [1 ]
机构：
[1] OPTOELECTR TECHNOL RES LAB,OTL,TSUKUBA,IBARAKI 30026,JAPAN
来源：
1996 EIGHTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS | 1996年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：618 / 621
页数：4
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