Multi-level Reliability Simulation for IC Design

CMOS IC design is challenged by the ever-increasing reliability issues, demanding highly accurate and efficient reliability simulation methodology. This paper presents multi-level solutions for reliability prediction in digital and analog design, including (1) device-level long-term aging models that capture unique operation patterns in digital and analog design, (2) circuit-level simulation method for analog reliability analysis, and (3) gate-level reliability simulation for large-scale digital designs. These solutions are integrated into IC design tools, helping diagnose critical conditions for circuit failure and enable adaptive design for resilience.