Recent Developments on X-ray Phase Contrast Imaging Technology at CSEM

被引：5
|
作者：
Kottler, Christian [1 ]
Revol, Vincent [1 ]
Kaufmann, Rolf [1 ]
Urban, Claus [1 ]
Blanc, Nicolas [1 ]
Niedermann, Philippe [2 ]
Cardot, Francis [2 ]
Dommann, Alex [2 ]
机构：
[1] Ctr Suisse Elect & Microtech SA, Technopk Str 1, CH-8005 Zurich, Switzerland
[2] Ctr Suisse Elect & Microtech SA, CH-2002 Neuchatel, Switzerland
来源：
INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS | 2012年 / 1466卷
关键词：
X-ray; differential phase contrast; imaging; grating interferometry; computerized tomography; fiber reinforced plastics; TALBOT INTERFEROMETRY; TOMOGRAPHY;
D O I：
10.1063/1.4742263
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
X-ray phase contrast imaging (XPCi) using the Talbot-Lau grating interferometer attracts increasing attention for its implementation in various fields of applications such as in the (bio-) medical domain, non-destructive testing or security. Since the method is compatible with laboratory X-ray tube sources as well as with large field of view digital X-ray image sensors, it has a large potential to provide XPCi for industrial and medical applications as widespread as conventional X-raying is. Here, we report on our recent results and measurements regarding the grating interferometer technology.
引用
收藏
页码：18 / 22
页数：5
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