Structural and electrical characterization of ultra-thin SrTiO3 tunnel barriers grown over YBa2Cu3O7 electrodes for the development of high Tc Josephson junctions

被引：6

作者：

Aviles Felix, L. ^{[1
]}

Sirena, M. ^{[1
,2
]}

Agueero Guzman, L. A. ^{[3
]}

Gonzalez Sutter, J. ^{[3
]}

Pons Vargas, S. ^{[3
]}

Steren, L. B. ^{[2
,4
]}

Bernard, R. ^{[5
]}

Trastoy, J. ^{[5
]}

Villegas, J. E. ^{[5
]}

Briatico, J. ^{[5
]}

Bergeal, N. ^{[6
]}

Lesueur, J. ^{[6
]}

Faini, G. ^{[7
]}

机构：

[1] Univ Nacl Cuyo, Inst Balseiro CNEA, Ctr Atom Bariloche, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina

[2] Consejo Nacl Invest Cient & Tecn, Caba, Argentina

[3] Univ Concepcion, Concepcion 2613, Chile

[4] Ctr Atom Constituyentes, RA-1650 Buenos Aires, DF, Argentina

[5] Univ Paris 11, Unite Mixte Phys CNRS THALES, F-91767 Palaiseau, France

[6] ESPCI ParisTech, CNRS, UMR8213, Lab Phys & Etud Mat, F-75005 Paris, France

[7] LPN CNRS, F-91460 Marcoussis, France

来源：

NANOTECHNOLOGY | 2012年 / 23卷 / 49期

关键词：

OXIDE;

D O I：

10.1088/0957-4484/23/49/495715

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The transport properties of ultra-thin SrTiO3 (STO) layers grown over YBa2Cu3O7 electrodes were studied by conductive atomic force microscopy at the nano-scale. A very good control of the barrier thickness was achieved during the deposition process. A phenomenological approach was used to obtain critical parameters regarding the structural and electrical properties of the system. The STO layers present an energy barrier of 0.9 eV and an attenuation length of 0.23 nm, indicating very good insulating properties for the development of high-quality Josephson junctions.

引用

页数：6

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