Changes of X-ray diffraction pattern in ferroelectrics due to the field-induced phase transition
被引:0
|
作者:
Wang, JT
论文数: 0引用数: 0
h-index: 0
机构:
So Univ, Dept Phys, Baton Rouge, LA 70813 USASo Univ, Dept Phys, Baton Rouge, LA 70813 USA
Wang, JT
[1
]
Tang, F
论文数: 0引用数: 0
h-index: 0
机构:So Univ, Dept Phys, Baton Rouge, LA 70813 USA
Tang, F
Jones, P
论文数: 0引用数: 0
h-index: 0
机构:So Univ, Dept Phys, Baton Rouge, LA 70813 USA
Jones, P
Chen, TP
论文数: 0引用数: 0
h-index: 0
机构:So Univ, Dept Phys, Baton Rouge, LA 70813 USA
Chen, TP
机构:
[1] So Univ, Dept Phys, Baton Rouge, LA 70813 USA
[2] A&M Coll, Baton Rouge, LA 70813 USA
[3] Univ N Dakota, Dept Phys, Grand Forks, ND 58202 USA
来源:
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
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2001年
/
15卷
/
24-25期
关键词:
X-ray diffraction pattern;
ferroelectrics;
D O I:
10.1142/S0217979201007786
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Recently the remarkable discovery of field-induced phase transition from antiferroelectric (AFE) to Ferroelectric (FE) in ferroelectrics excited the scientific community in this field. This finding has both scientific and technological implications to us. In this paper, we studied the changes of the crystal structure when an electrical field is applied to it. The X-ray diffraction pattern reflecting these changes was discussed by theoretical calculation.