Epitaxial growth of γ-Ga2O3 films by mist chemical vapor deposition

被引:106
作者
Oshima, Takayoshi [1 ]
Nakazono, Taishi [1 ]
Mukai, Akira [1 ]
Ohtomo, Akira [1 ,2 ]
机构
[1] Tokyo Inst Technol, Dept Appl Chem, Tokyo 1528552, Japan
[2] Japan Sci & Technol Agcy, ALCA, Tokyo 1020076, Japan
基金
日本学术振兴会;
关键词
Polymorphism; Chemical vapor deposition processes; Hot wall epitaxy; Ga2O3; Semiconducting gallium compounds; BETA-GA2O3; SINGLE-CRYSTALS; ALPHA-AL2O3;
D O I
10.1016/j.jcrysgro.2012.08.025
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Undoped Ga2O3 thin films were synthesized from an aqueous solution by using mist chemical vapor deposition. The defective-spinel-type gamma-phase and corundum-type alpha-phase were epitaxially stabilized when deposited on (100) MgAl2O4 and (0001) sapphire substrates, respectively. The epitaxial relationship for the gamma-phase film was identified to be cube on cube. We found that these metastable phases were obtained at lower growth temperatures, which gradually transformed to the stable beta-phase with increasing temperatures. The temperature dependence of growth rate on the MgAl2O4 exhibited a clear transition from surface-reaction-limited to diffusion-limited regime and a growth window for the gamma-phase was found in the vicinity of the transition. For a pure gamma-phase film, refractive index in a visible region, direct and indirect band-gaps were estimated to be 2.0 similar to 2.1, 5.0 and 4.4 eV, respectively, at room temperature. Crown Copyright (C) 2012 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:60 / 63
页数:4
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