breakdown time delay distributions;
Laue distributions;
statistic breakdown voltages;
electrical breakdown;
commercial gas diode GE 155/500;
STATISTICAL-ANALYSIS;
MBAR PRESSURE;
NEON;
MECHANISMS;
NITROGEN;
VOLTAGE;
D O I:
暂无
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
The results of the electrical breakdown time delay statistical investigations in the "GE 155/500" gas diode (manufactured in factory General Electric) by the time delay measuring method are presented in this paper. This diode is usually used as a "starter" (with one bimetal electrode) whose function is electrode heating regularization in fluorescent tubes. The experimentally obtained Laue distributions for different voltages (from 240 V to 500 V) and different relaxation times (from 1 ms to 1500 ms), as well as the memory curves for different overvoltages (from 240 V to 500 V), are presented. The results indicate that time delays in the "GE 155/500" diode don't depend on the number of switches, and that have god characteristic for commercial using.