THE ELECTRICAL BREAKDOWN TIME DELAY DISTRIBUTIONS IN "GE 155/500" GAS DIODE (STARTER)

被引：0
|
作者：
Maluckov, C. A. [1 ]
Radovic, M. K. [2 ]
Rancev, S. A. [2 ]
Ristic, G. S. [3 ]
Karamarkovic, J. P. [4 ]
机构：
[1] Univ Belgrade, Tech Fac Bor, Bor 19210, Serbia
[2] Univ Nis, Fac Sci & Math, Dept Phys, Nish 18001, Serbia
[3] Univ Nis, Fac Elect Enginnering, Nish 18000, Serbia
[4] Univ Nis, Fac Civil Enginnering, Nish 18000, Serbia
来源：
ROMANIAN REPORTS IN PHYSICS | 2013年 / 65卷 / 04期
关键词：
breakdown time delay distributions; Laue distributions; statistic breakdown voltages; electrical breakdown; commercial gas diode GE 155/500; STATISTICAL-ANALYSIS; MBAR PRESSURE; NEON; MECHANISMS; NITROGEN; VOLTAGE;
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The results of the electrical breakdown time delay statistical investigations in the "GE 155/500" gas diode (manufactured in factory General Electric) by the time delay measuring method are presented in this paper. This diode is usually used as a "starter" (with one bimetal electrode) whose function is electrode heating regularization in fluorescent tubes. The experimentally obtained Laue distributions for different voltages (from 240 V to 500 V) and different relaxation times (from 1 ms to 1500 ms), as well as the memory curves for different overvoltages (from 240 V to 500 V), are presented. The results indicate that time delays in the "GE 155/500" diode don't depend on the number of switches, and that have god characteristic for commercial using.
引用
收藏
页码：1373 / 1383
页数：11
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