Radiation-induced defects in As-Sb-S glass

被引：0
作者：
Balitska, V. [1 ,2 ]
Shpotyuk, Ya [1 ,3 ]
Filipecki, J. [4 ]
Shpotyuk, O. [1 ,4 ]
机构：
[1] Lviv Sci Res Inst Mat SRC Carat, 202 Stryjska Str, UA-79031 Lvov, Ukraine
[2] Lviv Lviv State Univ Vital Funct Safety, UA-79023 Lvov, Ukraine
[3] Ivan Franko Natl Univ Lviv, UA-79005 Lvov, Ukraine
[4] Jan Dlugosz Univ, Inst Phys, PL-42200 Czestochowa, Poland
来源：
11TH EUROPHYSICAL CONFERENCE ON DEFECTS IN INSULATING MATERIALS (EURODIM 2010) | 2010年 / 15卷
关键词：
D O I：
10.1088/1757-899X/15/1/012054
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Defect-related instability was studied in gamma-irradiated (As2S3)(1-x)(Sb2S3) x glasses (x=0, 0.1, 0.2 and 0.3) using positron annihilation lifetime spectroscopy treated within high-measurement statistics. The observed decrease in average positron lifetime in the studied glasses is explained as a renovation of destroyed covalent chemical bonds after irradiation. This process is governed by monomolecular relaxation kinetics, being described in the framework of universal configuration-coordinate model.
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页数：6
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