The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction

被引:66
作者
Harb, M. [1 ]
Schmising, C. von Korff [1 ]
Enquist, H. [2 ]
Jurgilaitis, A. [1 ]
Maximov, I. [3 ]
Shvets, P. V. [4 ]
Obraztsov, A. N. [4 ,5 ]
Khakhulin, D. [6 ]
Wulff, M. [6 ]
Larsson, J. [1 ]
机构
[1] Lund Univ, Dept Phys, Atom Phys Div, S-22100 Lund, Sweden
[2] Lund Univ, Max Lab, S-22100 Lund, Sweden
[3] Lund Univ, Div Solid State Phys, Nanometer Struct Consortium, S-22100 Lund, Sweden
[4] Moscow MV Lomonosov State Univ, Dept Phys, Moscow 119991, Russia
[5] Univ Eastern Finland, Dept Math & Phys, Joensuu 80101, Finland
[6] European Synchrotron Radiat Facil, F-38043 Grenoble, France
基金
加拿大自然科学与工程研究理事会; 瑞典研究理事会; 俄罗斯基础研究基金会;
关键词
GRAPHENE;
D O I
10.1063/1.4769214
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the use of time resolved X-ray diffraction to measure the dynamics of strain in laser-excited graphite film of nanometer thickness, obtained by chemical vapour deposition (CVD). Heat transport in the CVD film is simulated with a 1-dimensional heat diffusion model. We find the experimental data to be consistent with a c-axis thermal conductivity of similar to 0.7 Wm(-1) K-1. This value is four orders of magnitude lower than the thermal conductivity in-plane, confirming recent theoretical calculations of the thermal conductivity of multilayer graphene. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769214]
引用
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页数:4
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