A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

被引：38

作者：

Loveless, T. Daniel ^{[1
]}

Massengill, Lloyd W. ^{[1
]}

Bhuva, Bharat L. ^{[1
]}

Holman, W. Timothy ^{[1
]}

Casey, Megan C. ^{[1
]}

Reed, Robert A. ^{[1
]}

Nation, Sarah A. ^{[1
]}

McMorrow, Dale ^{[2
]}

Melinger, Joseph S. ^{[2
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA

[2] USN, Res Lab, Washington, DC 20375 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 06期

关键词：

Delay-locked loops; phase-locked loops; radiation effects; radiation hardening; single-event transients; voltage-controlled oscillators;

D O I：

10.1109/TNS.2008.2005677

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A voltage-controlled-oscillator (VCO) circuit has been designed for radiation-hardened-by-design (RHBD) single-event transient (SET) mitigation. The RHBD technique, which can be readily implemented in mixed-signal phase-locked loops and delay-locked loops, is shown to substantially improve the single-event performance of the VCO while decreasing the rms phase jitter due to power supply noise. Additionally, using the probabilistic analysis technique presented, the RHBD VCO shows a maximally improved SET response over that of the conventional VCO, decreasing the output phase displacement to below the nominal phase jitter.

引用

页码：3447 / 3455

页数：9

共 25 条

[1]

[Anonymous], 1993, IEEE NSREC SHORT COU

[2] SIMULTANEOUS MEASUREMENT OF THE 2-PHOTON COEFFICIENT AND FREE-CARRIER CROSS-SECTION ABOVE THE BANDGAP OF CRYSTALLINE SILICON [J].

BOGGESS, TF ;

BOHNERT, KM ;

MANSOUR, K ;

MOSS, SC ;

BOYD, IW ;

SMIRL, AL .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1986, 22 (02) :360-368

[3] Effects of technology scaling on the SET sensitivity of RF CMOS voltage-controlled oscillators [J].

Boulghassoul, Y ;

Massengill, LW ;

Sternberg, AL ;

Bhuva, BL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2005, 52 (06) :2426-2432

[4] Design and analysis of noise tolerant ring oscillators using Maneatis delay cells [J].

Carnes, Josh ;

Vytyaz, Igor ;

Hanumolu, Pavan Kumar ;

Mayaram, Kartikeya ;

Moon, Un-Ku .

2007 14TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-4, 2007, :494-497

[5] Impact of VCO topology on SET induced frequency response [J].

Chen, Wenjian ;

Varanasi, Niha ;

Pouget, Vincent ;

Barnaby, Hugh J. ;

Vermeire, Bert ;

Adell, Philippe C. ;

Copani, Tino ;

Fouillat, Pascal .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) :2500-2505

[6] Investigation of single-event transients in voltage-controlled oscillators [J].

Chen, WJ ;

Pouget, V ;

Barnaby, HJ ;

Cressler, JD ;

Niu, GF ;

Fouillat, P ;

Deval, Y ;

Lewis, D .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (06) :2081-2087

[7] Analysis of single events effects on monolithic PLL frequency synthesizers [J].

Chung, Hoon Hee ;

Chen, Wenjian ;

Bakkaloglu, Bertan ;

Barnaby, Hugh J. ;

Vermeire, Bert ;

Kiaei, Sayfe .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (06) :3539-3543

[8]

DasGupta S., 2007, THESIS VANDERBILT U

[9] Basic mechanisms and modeling of single-event upset in digital microelectronics [J].

Dodd, PE ;

Massengill, LW .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (03) :583-602

[10] SEU cross sections of hardened and unhardened SiGe circuits [J].

Hansen, D. L. ;

Chu, P. ;

Jobe, K. ;

McKay, A. L. ;

Warren, H. P. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (06) :3579-3586

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