Subsurface-AFM: sensitivity to the heterodyne signal

被引:26
作者
Verbiest, G. J. [1 ]
Oosterkamp, T. H. [1 ]
Rost, M. J. [1 ]
机构
[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands
关键词
ATOMIC-FORCE MICROSCOPE; HIGH-FREQUENCY RESPONSE; VIBRATIONS; SAMPLE; CANTILEVER; ADHESION; CONTACT;
D O I
10.1088/0957-4484/24/36/365701
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Applying heterodyne force microscopy (HFM), it has been impressively demonstrated that it is possible to obtain subsurface information: 20 nm large gold nanoparticles that were buried 500 nm deep have been imaged. It is the heterodyne signal that contains the subsurface information. We elucidate, both theoretically and experimentally, the sensitivity to the heterodyne signal as a function of the tip-sample distance. This is crucial information for experiments as the distance, and therefore the sensitivity, is tunable. We show that the amplitude of the heterodyne signal has a local maximum in the attractive part of the tip-sample interaction, before it surprisingly reaches an even higher plateau, when the tip-sample interaction is repulsive. This can only be explained by a non-decreasing amplitude of the ultrasonic motion of the tip, although it is in full contact with the surface. We confirm this counterintuitive tip behavior experimentally even on a hard surface like silicon.
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页数:6
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共 31 条
[1]  
[Anonymous], 2011, PIEZOELECTRIC ENERGY, DOI DOI 10.1002/9781119991151.APP1
[2]   Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy [J].
Argento, C ;
French, RH .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (11) :6081-6090
[3]   Adhesive elastic contacts: JKR and more [J].
Barthel, E. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (16)
[4]   Analytical model of the nonlinear dynamics of cantilever tip-sample surface interactions for various acoustic atomic force microscopies [J].
Cantrell, John H. ;
Cantrell, Sean A. .
PHYSICAL REVIEW B, 2008, 77 (16)
[5]   Nanoscale subsurface imaging via resonant difference-frequency atomic force ultrasonic microscopy [J].
Cantrell, Sean A. ;
Cantrell, John H. ;
Lillehei, Peter T. .
JOURNAL OF APPLIED PHYSICS, 2007, 101 (11)
[6]   Intermittent-Contact Heterodyne Force Microscopy [J].
Cuberes, M. Teresa .
JOURNAL OF NANOMATERIALS, 2009, 2009
[7]   EFFECT OF CONTACT DEFORMATIONS ON ADHESION OF PARTICLES [J].
DERJAGUIN, BV ;
MULLER, VM ;
TOPOROV, YP .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1975, 53 (02) :314-326
[8]   A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forces [J].
Eslami, Sohrab ;
Jalili, Nader .
ULTRAMICROSCOPY, 2012, 117 :31-45
[9]   Theoretical description of the transfer of vibrations from a sample to the cantilever of an atomic force microscope [J].
Hirsekorn, S ;
Rabe, U ;
Arnold, W .
NANOTECHNOLOGY, 1997, 8 (02) :57-66
[10]   Transfer of mechanical vibrations from a sample to an AFM-cantilever - a theoretical description [J].
Hirsekorn, S .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S249-S254