Potential analytical applications of negative ions from a pulsed radiofrequency glow discharge in argon

被引：25

作者：

Canulescu, Stela ^{[1
]}

Whitby, James ^{[1
,2
]}

Fuhrer, Katrin ^{[2
]}

Hohl, Markus ^{[2
]}

Gonin, Marc ^{[2
]}

Horvath, Thomas ^{[2
]}

Michler, Johann ^{[1
]}

机构：

[1] EMPA Mat Sci & Technol, CH-3602 Thun, Switzerland

[2] Tofwerk AG, CH-3600 Thun, Switzerland

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2009年 / 24卷 / 02期

关键词：

MASS-SPECTROMETRY;

D O I：

10.1039/b818954d

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Detection of negative ions from a conventional analytical glow discharge source using argon as the working gas is reported. The negative ions are recorded using a pulsed discharge source coupled with a time-of-flight mass spectrometer. A considerable enhancement in the "afterglow" region of the negative ion signal for halogens and halogenated molecules and reduction in background is observed. This is the first time when negative ions have been reported for halogen containing materials and we illustrate our findings with results from the polytetrafluoroethene polymer (PTFE).

引用

页码：178 / 180

页数：3

共 9 条

[1] NEGATIVE-IONS OF SPUTTERED CATHODE SPECIES IN A GLOW-DISCHARGE [J].