Low-voltage, high speed inkjet-printed flexible complementary polymer electronic circuits

被引:63
作者
Baeg, Kang-Jun [2 ]
Jung, Soon-Won [3 ]
Khim, Dongyoon [4 ]
Kim, Juhwan [4 ]
Kim, Dong-Yu [4 ]
Koo, Jae Bon [3 ]
Quinn, Jordan R. [5 ]
Facchetti, Antonio [5 ]
You, In-Kyu [3 ]
Noh, Yong-Young [1 ]
机构
[1] Dongguk Univ, Dept Energy & Mat Engn, Seoul 100715, South Korea
[2] KERI, Nano Carbon Mat Res Grp, Chang Won 642120, Gyeongsangnam D, South Korea
[3] ETRI, IT Mat & Components Lab, Taejon 305700, South Korea
[4] GIST, Sch Mat Sci & Engn, Heeger Ctr Adv Mat, Kwangju 500712, South Korea
[5] Polyera Corp, Skokie, IL 60077 USA
基金
新加坡国家研究基金会;
关键词
Organic field-effect transistor; Complementary circuit; Conjugated polymer; Dielectric blends; Printed electronics; FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; SELF-ASSEMBLED MONOLAYERS; CHARGE INJECTION; GATE DIELECTRICS; INTEGRATED-CIRCUITS; ORGANIC TRANSISTORS; WORK-FUNCTION; PERFORMANCE; TRANSPORT;
D O I
10.1016/j.orgel.2012.12.022
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the development of high-performance inkjet-printed organic field-effect transistors (OFETs) and complementary circuits using high-k polymer dielectric blends comprising poly(vinylidenefluoride-trifluoroethylene) (P(VDF-TrFE)) and poly(methyl methacrylate) (PMMA) for high-speed and low-voltage operation. Inkjet-printed p-type polymer semiconductor scontaining alkyl-substituted thienylenevinylene (TV) and dode-cylthiophene (PC12TV12T) and n-type P(NDI2OD-T2) OFETs showed high field-effect mobilities of 0.1-0.4 cm(2)V(-1)s(-1) and low threshold voltages down to 5V. These OFET properties were modified by changing the blend ratio of P(VDF-TrFE) and PMMA. The optimum blend - a 7:3 wt% mixture of P(VDF-TrFE) and PMMA - was successfully used to realize high-performance complementary inverters and ring oscillators (ROs). The complementary ROs operated at asupplied bias (V-DD) of 5 V and showed an oscillation frequency (f(osc)) as high as similar to 80 kHz at V-DD = 30 V. Furthermore, the f(osc) of the complementary ROs was significantly affected by a variety of fundamental parameters such as the electron and hole mobilities, channel width and length, capacitance of the gate dielectrics, VDD, and the overlap capacitance in the circuit configuration. (C) 2013 Elsevier B. V. All rights reserved.
引用
收藏
页码:1407 / 1418
页数:12
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