Sputtered ion emission under size-selected Arn+ cluster ion bombardment

被引:20
作者
Gnaser, Hubert [1 ,2 ]
Ichiki, Kazuya [3 ]
Matsuo, Jiro [3 ,4 ]
机构
[1] Univ Kaiserslautern, Dept Phys, D-67663 Kaiserslautern, Germany
[2] Univ Kaiserslautern, Res Ctr OPTIMAS, D-67663 Kaiserslautern, Germany
[3] Kyoto Univ, Quantum Sci & Engn Ctr, Uji, Kyoto 6110011, Japan
[4] Japan Sci & Technol Agcy JST, CREST, Chiyoda Ku, Tokyo 1020075, Japan
基金
日本学术振兴会;
关键词
Ar cluster ions; sputtered ion emission; ionization efficiency; ORGANIC MASS-SPECTROMETRY; SECONDARY IONS; TOF-SIMS; BEAMS; FILMS; C-60(+); TIME; SIMULATIONS; POLYMERS; DYNAMICS;
D O I
10.1002/sia.4914
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The emission of positive secondary ions from four amino acids (arginine, glycine, phenylalanine, and tyrosine) and from NaCl under irradiation with large Ar-n(+) cluster ions was investigated by time-of-flight secondary ion mass spectrometry. Size-selected 5.5-keV Ar-n(+) cluster ions with 300 <= n <= 2000 were used, and the flux of sputtered positive ions was monitored as function of cluster size n. For all cluster sizes, the protonated or the cationized molecular ions are observed in the mass spectra. In addition, the results show that with increasing cluster size, the number of fragment molecules strongly decreases in relation to the intact molecules, to the extent that the ratio of fragment to intact ions is 10% or less for the largest cluster ions. Generally, the ion yields Y+ were found to decrease for decreasing impact energy per cluster atom, E/n, and this attenuation was recorded down to values as low as E/n similar to 3 eV/atom. The general trend of Y+ versus E/n is similar for all targets and appears to follow a power-law dependence, Y+ proportional to(E/n)(x), with x similar to 4. This pronounced yield change could be ascribed to a reduction of the ionization probability which is envisaged to depend on the presence of free protons. Their number is expected to decrease concurrently with the decreasing amount of fragmentation for large cluster ions (i.e. for low energies/atom). Copyright (C) 2012 John Wiley & Sons, Ltd.
引用
收藏
页码:138 / 142
页数:5
相关论文
共 48 条
[1]  
Benninghoven A., 1987, Secondary ion mass spectrometry: basic concepts, instrumental aspects, applications and trends
[2]   Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis [J].
Biddulph, Gregory X. ;
Piwowar, Alan M. ;
Fletcher, John S. ;
Lockyer, Nicholas P. ;
Vickerman, John C. .
ANALYTICAL CHEMISTRY, 2007, 79 (19) :7259-7266
[3]   Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions? [J].
Conlan, XA ;
Lockyer, NP ;
Vickerman, JC .
RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2006, 20 (08) :1327-1334
[4]   Depth profiling of organic materials using improved ion beam conditions [J].
Cramer, H. -G. ;
Grehl, T. ;
Kollmer, F. ;
Moellers, R. ;
Niehuis, E. ;
Rading, D. .
APPLIED SURFACE SCIENCE, 2008, 255 (04) :966-969
[5]   Sputtering softmaterials with molecular projectiles: a microscopic view [J].
Delcorte, A. ;
Garrison, B. J. ;
Hamraoui, K. .
SURFACE AND INTERFACE ANALYSIS, 2011, 43 (1-2) :16-19
[6]   Dynamics of Molecular Impacts on Soft Materials: From Fullerenes to Organic Nanodrops [J].
Delcorte, A. ;
Garrison, B. J. ;
Hamraoui, K. .
ANALYTICAL CHEMISTRY, 2009, 81 (16) :6676-6686
[7]   DEVELOPMENTS IN MOLECULAR SIMS DEPTH PROFILING AND 3D IMAGING OF BIOLOGICAL SYSTEMS USING POLYATOMIC PRIMARY IONS [J].
Fletcher, John S. ;
Lockyer, Nicholas P. ;
Vickerman, John C. .
MASS SPECTROMETRY REVIEWS, 2011, 30 (01) :142-174
[8]   A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems [J].
Fletcher, John S. ;
Vickerman, John C. .
ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2010, 396 (01) :85-104
[9]   Computational view of surface based organic mass spectrometry [J].
Garrison, Barbara J. ;
Postawa, Zbigniew .
MASS SPECTROMETRY REVIEWS, 2008, 27 (04) :289-315
[10]   Internal Energy of Molecules Ejected Due to Energetic C60 Bombardment [J].
Garrison, Barbara J. ;
Postawa, Zbigniew ;
Ryan, Kathleen E. ;
Vickerman, John C. ;
Webb, Roger P. ;
Winograd, Nicholas .
ANALYTICAL CHEMISTRY, 2009, 81 (06) :2260-2267