The effect of growth parameters on the electrical, optical and structural properties of copper phthalocyanine thin films

被引：162
作者：
Ambily, S [1 ]
Menon, CS [1 ]
机构：
[1] Mahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
来源：
THIN SOLID FILMS | 1999年 / 347卷 / 1-2期
关键词：
phthalocyanines; activation energy; optical; X-ray diffractogram; annealing;
D O I：
10.1016/S0040-6090(98)01744-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Vacuum sublimed thin films of copper phthalocyanine are prepared at room temperature and at different substrate temperatures. Post evaporation annealing is done at temperatures of 323, 373, 423 and 473 K. The electrical conductivity and optical absorption spectra of these films are studied. Their structure and structure related microcrystalline grain size are determined. (C) 1999 Elsevier Science S.A. All rights reserved.
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页码：284 / 288
页数：5
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