Negative Capacitance Carbon Nanotube FETs

被引:39
|
作者
Srimani, Tathagata [1 ]
Hills, Gage [2 ]
Bishop, Mindy D. [1 ]
Radhakrishna, Ujwal [1 ]
Zubair, Ahmad [1 ]
Park, Rebecca S. [2 ]
Stein, Yosi [3 ]
Palacios, Tomas [1 ]
Antoniadis, Dimitri [1 ]
Shulaker, Max M. [1 ]
机构
[1] MIT, 77 Massachusetts Ave, Cambridge, MA 02139 USA
[2] Stanford Univ, Stanford, CA 94305 USA
[3] Analog Devices Inc, Norwood, MA 02062 USA
基金
美国国家科学基金会;
关键词
Negative capacitance; carbon nanotube; field-effect transistors; very-large-scale integration; IMPROVEMENT; DESIGN;
D O I
10.1109/LED.2017.2781901
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As continued scaling of silicon FETs grows increasingly challenging, alternative paths for improving digital system energy efficiency are being pursued. These paths include replacing the transistor channel with emerging nanomaterials (such as carbon nanotubes), as well as utilizing negative capacitance effects in ferroelectric materials in the FET gate stack, e.g., to improve sub-threshold slope beyond the 60 mV/decade limit. However, which path provides the largest energy efficiency benefits-and whether these multiple paths can be combined to achieve additional energy efficiency benefits-is still unclear. Here, we experimentally demonstrate the first negative capacitance carbon nanotube FETs (CNFETs), combining the benefits of both carbon nanotube channels and negative capacitance effects. We demonstrate negative capacitance CNFETs, achieving sub-60 mV/decade sub-threshold slope with an average sub-threshold slope of 55 mV/decade at room temperature. The average ON-current (I-ON) of these negative capacitance CNFETs improves by 2.1x versus baseline CNFETs, (i.e., without negative capacitance) for the same OFF-current (I-OFF). This work demonstrates a promising path forward for future generations of energy-efficient electronic systems.
引用
收藏
页码:304 / 307
页数:4
相关论文
共 50 条
  • [41] Utilization of Negative-Capacitance FETs to Boost Analog Circuit Performances
    Liang, Yuhua
    Zhu, Zhangming
    Li, Xueqing
    Gupta, Sumeet Kumar
    Datta, Suman
    Narayanan, Vijaykrishnan
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 27 (12) : 2855 - 2860
  • [42] Polarization Charge and Coercive Field Dependent Performance of Negative Capacitance FETs
    Aziz, Ahmedullah
    Ghosh, Swapnadip
    Gupta, Sumeet K.
    Datta, Suman
    2016 74TH ANNUAL DEVICE RESEARCH CONFERENCE (DRC), 2016,
  • [43] Work Function Engineering for Performance Improvement in Leaky Negative Capacitance FETs
    Khan, Asif Islam
    Radhakrishna, Ujwal
    Salahuddin, Sayeef
    Antoniadis, Dimitri
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (09) : 1335 - 1338
  • [44] Circuit-level Modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs
    Hashempour, Hamidreza
    Lombardi, Fabrizio
    2007 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3, 2007, : 841 - 846
  • [45] Physical Unclonable Functions based on Carbon Nanotube FETs
    Moradi, Mona
    Tao, Sha
    Mirzaee, Reza Faghih
    2017 IEEE 47TH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC (ISMVL 2017), 2017, : 124 - 129
  • [46] Small signal model and analog performance analysis of negative capacitance FETs
    Eslahi, Hossein
    Hamilton, Tara J.
    Khandelwal, Sourabh
    SOLID-STATE ELECTRONICS, 2021, 186
  • [47] Computational Investigation of Negative Capacitance Coaxially Gated Carbon Nanotube Field-Effect Transistors
    Tamersit, Khalil
    Jooq, Mohammad Khaleqi Qaleh
    Moaiyeri, Mohammad Hossein
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (01) : 376 - 384
  • [48] Quantum Capacitance Extraction for Carbon Nanotube Interconnects
    Vidur Parkash
    Ashok K Goel
    Nanoscale Research Letters, 5
  • [49] Quantum capacitance mediated carbon nanotube optomechanics
    Blien, Stefan
    Steger, Patrick
    Huttnen, Niklas
    Graaf, Richard
    Huttel, Andreas K.
    NATURE COMMUNICATIONS, 2020, 11 (01)
  • [50] Quantum Capacitance Extraction for Carbon Nanotube Interconnects
    Parkash, Vidur
    Goel, Ashok K.
    2008 INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2008, : 292 - +