Non-uniformity correction of resistor arrays with a precision projector/sensor mapping method

被引：6

作者：

Venables, MA ^{[1
]}

Lake, SP ^{[1
]}

Gough, DW ^{[1
]}

Pritchard, AP ^{[1
]}

机构：

[1] British Aerosp Sowerby Res Ctr, Bristol BS34 7QW, Avon, England

来源：

TECHNOLOGIES FOR SYNTHETIC ENVIRONMENTS: HARDWARE-IN-THE-LOOP TESTING IV | 1999年 / 3697卷

关键词：

infra-red scene projectors; resistor arrays; hardware-in-the-loop simulation; non-uniformity correction;

D O I：

10.1117/12.352920

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

We present a description of a new non-uniformity correction system for infra-red resistor arrays which has been designed to produce the maximum uniformity of output from neighbour pixels achievable, with a special emphasis on performance at low (ambient) output radiance levels. The system is based on a precision 1:1 mapping between the sensor and projector pixels, and utilises an all-on approach for projector pixel illumination. The philosophy for system choices is presented, together with analyses and measurements. The system hardware is outlined, and measurements are presented from the system in use showing that at ambient levels, uniformity of better than 100 mK can be achieved between neighbour pixels. This corresponds to a uniformity deviation of some 0.35%.

引用

页码：414 / 421

页数：8

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