Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks

被引:76
作者
Adibhatla, Venkat Anil [1 ,2 ]
Chih, Huan-Chuang [2 ]
Hsu, Chi-Chang [2 ]
Cheng, Joseph [2 ]
Abbod, Maysam F. [3 ]
Shieh, Jiann-Shing [1 ]
机构
[1] Yuan Ze Univ, Dept Mech Engn, Taoyuan 32003, Taiwan
[2] Boardtek Elect Corp, Dept Adv Mfg Syst, Taoyuan 328454, Taiwan
[3] Brunel Univ London, Dept Elect & Comp Engn, Uxbridge UB8 3PH, Middx, England
关键词
convolution neural network; YOLO; deep learning; printed circuit board; DEPTH;
D O I
10.3390/electronics9091547
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this study, a deep learning algorithm based on the you-only-look-once (YOLO) approach is proposed for the quality inspection of printed circuit boards (PCBs). The high accuracy and efficiency of deep learning algorithms has resulted in their increased adoption in every field. Similarly, accurate detection of defects in PCBs by using deep learning algorithms, such as convolutional neural networks (CNNs), has garnered considerable attention. In the proposed method, highly skilled quality inspection engineers first use an interface to record and label defective PCBs. The data are then used to train a YOLO/CNN model to detect defects in PCBs. In this study, 11,000 images and a network of 24 convolutional layers and 2 fully connected layers were used. The proposed model achieved a defect detection accuracy of 98.79% in PCBs with a batch size of 32.
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页数:16
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