Refractive index spectroscopy and material dispersion in fused silica glass

被引：38

作者：

Arosa, Yago

de la Fuente, Raul ^{[1
]}

机构：

[1] Univ Santiago de Compostela, Nanomat Foton & Mat Branda NaFoMat, Dept Fis Aplicada, Campus Vida, Santiago De Compostela 15782, Spain

来源：

OPTICS LETTERS | 2020年 / 45卷 / 15期

关键词：

WHITE-LIGHT; SIMULTANEOUS THICKNESS;

D O I：

10.1364/OL.395510

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this study, we aimed to measure material dispersion in fused silica using a low coherence interferometric method. The measurement was carried out quickly and efficiently in a wide spectral range using this method. The refractive index and group index of fused silica were determined by capturing a few interferograms. The material dispersion was modeled using a Sellmeier equation with three resonances. Three different fits were investigated; the most appropriate fit was the one that used both the measured refractive and group indexes to model the dispersion. Second-order dispersion was also quantified, and zero-dispersion wavelength was determined. (C) 2020 Optical Society of America

引用

页码：4268 / 4271

页数：4

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