Measurement of frequency-dependent equivalent width of substrate integrated waveguide

被引：44

作者：

Tseng, CH ^{[1
]}

Chu, TH

机构：

[1] Calif State Univ Los Angeles, Dept Elect Engn, Los Angeles, CA 90032 USA

[2] Natl Taiwan Univ, Dept Elect Engn, Taipei 106, Taiwan

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2006年 / 54卷 / 04期

关键词：

calibration; dielectric measurements; microwave measurement; substrate integrated waveguides (SIWs);

D O I：

10.1109/TMTT.2006.871245

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a method is developed to measure the frequency-dependent equivalent width (FDEW) of the substrate integrated waveguide (SIW). Based on the deembedding concept, the formulas of the measurement procedures are derived, and then the measured equivalent width corresponding to each frequency is applied to the transmission/reflection method to acquire the substrate dielectric constant. The measurement method is experimentally verified over the frequency range from 26 to 40 GHz. The measured FDEW of the SIW is compared with that calculated by the empirical equation. Furthermore, the results of the measured dielectric constant are shown to be in reasonable agreement with those measured by the ring resonator method. It demonstrates that the developed method is an effective measurement approach to characterizing the SIW.

引用

页码：1431 / 1437

页数：7

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