HTS surface-modified junctions with integrated ground-planes for SFQ circuits

被引：0
作者：
Soutome, Y [1 ]
Fukazawa, T [1 ]
Saitoh, K [1 ]
Tsukamoto, A [1 ]
Takagi, K [1 ]
机构：
[1] Hitachi Ltd, Adv Res Lab, Kokubunji, Tokyo 1858601, Japan
来源：
IEICE TRANSACTIONS ON ELECTRONICS | 2002年 / E85C卷 / 03期
关键词：
high-temperature-superconductor; Josephson junction; SEQ circuit; ramp-edge junction; groundplane;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We fabricated ramp-edge junctions with barriers by modifying surface and integrating ground-planes. The fabricated junctions had current-voltage characteristics consistent with the resistive shunted-junction model. We also obtained a I-sigma spread in the critical current of 7.9% for 100 junctions at 4.2K. The ground-plane reduced the sheet inductance of a stripline by a factor of 3. The quality of the ground-plane was improved by using an anneal in oxygen atmosphere after fabrication. The sheet inductance of a counter-electrode with a ground-plane was 1.0 pH per square at 4.2 K.
引用
收藏
页码：759 / 763
页数：5
相关论文
共 13 条
  • [1] INDUCTANCE OF A SUPERCONDUCTING STRIP TRANSMISSION-LINE
    CHANG, WH
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8129 - 8134
  • [2] INDUCTANCE MEASUREMENTS IN MULTILEVEL HIGH-T(C) STEP-EDGE GRAIN-BOUNDARY SQUIDS
    FORRESTER, MG
    DAVIDSON, A
    TALVACCHIO, J
    GAVALER, JR
    PRZYBYSZ, JX
    [J]. APPLIED PHYSICS LETTERS, 1994, 65 (14) : 1835 - 1837
  • [3] Preparation of ramp-edge Josephson junctions with natural barriers
    Fujimaki, A
    Kawai, K
    Hayashi, N
    Horibe, M
    Maruyama, M
    Hayakawa, H
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 3436 - 3439
  • [4] High-T-c, superconductor/normal-metal/superconductor edge junctions and SQUIDs with integrated groundplanes
    Hunt, BD
    Forrester, MG
    Talvacchio, J
    McCambridge, JD
    Young, RM
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (26) : 3805 - 3807
  • [5] A multilayer YBaCu3Ox Josephson junction process for digital circuit applications
    Mallison, WH
    Berkowitz, SJ
    Hirahara, AS
    Neal, MJ
    Char, K
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (26) : 3808 - 3810
  • [6] Properties of interface-engineered high T-c Josephson junctions
    Moeckly, BH
    Char, K
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (17) : 2526 - 2528
  • [7] MOECKLY BH, 1997, P ISEC 97 BERL, P8
  • [8] HTS edge junction dependence on base electrode edge smoothness
    Murduck, J
    Pettiette-Hall, CL
    Hu, R
    Salazar, O
    McGerr, M
    Daly, K
    Luine, J
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 3354 - 3357
  • [9] High-temperature superconducting edge-type Josephson junctions with modified interfaces
    Satoh, T
    Hidaka, M
    Tahara, S
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 3141 - 3144
  • [10] Investigation of ramp-type Josephson junctions with surface-modified barriers
    Soutome, Y
    Hanson, R
    Fukazawa, T
    Saitoh, K
    Tsukamoto, A
    Tarutani, Y
    Takagi, K
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) : 163 - 166
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