A comprehensive simulation and test environment for prototype VLSI verification

被引:0
|
作者
Kobayashi, K [1 ]
Onodera, H
机构
[1] Univ Tokyo, Tokyo 1138656, Japan
[2] Kyoto Univ, Kyoto 6068501, Japan
来源
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | 2004年 / E87D卷 / 03期
关键词
simulation; test; VLSI; tester; verification;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes a comprehensive simulation and test environment for prototype LSI verification. We develop a Perl package, ST, for simulation & test of digital circuits. A designer can describe a testbench with the Pert syntax, which can be converted to various kinds of simulators and LSI testers. Parameters such as a target simulator/tester, cycle time and voltage levels can be changed very easily just modifying arguments of subroutines. We also develop DUT boards which consist of a tester-dependent mother board and a package-dependent daughter board. Using ST and the DUT boards, a designer can start verification just after getting fabricated LSIs.
引用
收藏
页码:630 / 636
页数:7
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