In situ monitoring of photostriction in chalcogenide glass film using fiber Bragg grating sensors

被引：2

作者：

Gayathri, Sivakumar ^{[1
]}

Varma, G. Sreevidya ^{[1
]}

Singh, Gagandeep ^{[1
]}

Shivananju, Bannur Nanjunda ^{[1
]}

Sridevi, S. ^{[1
]}

Umapathy, Siva ^{[2
]}

Gorthi, Sai Siva ^{[1
]}

Asokan, Sundarrajan ^{[1
,3
]}

机构：

[1] Indian Inst Sci, Dept Instrumentat & Appl Phys, CV Raman Rd, Bangalore 560012, Karnataka, India

[2] Indian Inst Sci, Dept Inorgan & Phys Chem, Bangalore, Karnataka, India

[3] Indian Inst Sci, Appl Photon Initiat, Bangalore, Karnataka, India

来源：

INTERNATIONAL JOURNAL OF OPTOMECHATRONICS | 2017年 / 11卷 / 01期

关键词：

ChG thin film; fiber Bragg grating sensor; optical actuation; photoinduced strain measurement; photostriction evaluation; OPTICAL-FIBER; WAVE-GUIDES; THIN-FILMS; PHOTOEXPANSION; LIGHT;

D O I：

10.1080/15599612.2017.1374490

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The reversible photostriction (photomechanical strain) in Ge35S65 chalcogenide thin film deposited by a solvent casting method has been monitored using a fiber Bragg grating (FBG) sensor. The shift in Bragg wavelength is used as a probing parameter to quantitatively measure the photoinduced strain arising because of structural modifications in these films under illumination. Exposure to band gap light (405 nm) and above band gap light (302 and 254 nm) leads to a reversible photostriction effect of the order of 100 mu epsilon. The present study shows that FBG sensors can be used to effectively measure the optomechanical actuation in chalcogenide films caused by the reversible photostriction effect in the visible and ultraviolet wavelength region.

引用

页码：27 / 35

页数：9

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