Low-energy electron reflectivity from graphene

被引：84

作者：

Feenstra, R. M. ^{[1
]}

Srivastava, N. ^{[1
]}

Gao, Qin ^{[1
]}

Widom, M. ^{[1
]}

Diaconescu, Bogdan ^{[2
]}

Ohta, Taisuke ^{[2
]}

Kellogg, G. L. ^{[2
]}

Robinson, J. T. ^{[3
]}

Vlassiouk, I. V. ^{[4
]}

机构：

[1] Carnegie Mellon Univ, Dept Phys, Pittsburgh, PA 15213 USA

[2] Sandia Natl Labs, Albuquerque, NM 87185 USA

[3] USN, Res Lab, Washington, DC 20375 USA

[4] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

PHYSICAL REVIEW B | 2013年 / 87卷 / 04期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevB.87.041406

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Low-energy reflectivity of electrons from single-and multilayer graphene is examined both theoretically and experimentally. A series of minima in the reflectivity over the energy range of 0-8 eV are found, with the number of minima depending on the number of graphene layers. Using first-principles computations, it is demonstrated that a freestanding n-layer graphene slab produces n - 1 reflectivity minima. This same result is also found experimentally for graphene supported on SiO2. For graphene bonded onto other substrates it is argued that a similar series of reflectivity minima is expected, although in certain cases an additional minimum occurs, at an energy that depends on the graphene-substrate separation and the effective potential in that space. DOI: 10.1103/PhysRevB.87.041406

引用

页数：4

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