A State Recovery Design against Single-Event Transient in High-speed Phase Interpolation Clock and Data Recovery Circuit

被引：0

作者：

Tan, Jiawei ^{[1
]}

Guo, Yang ^{[1
]}

Chen, Jianjun ^{[1
]}

Yuan, Hengzhou ^{[1
]}

Chen, Xi ^{[1
]}

机构：

[1] Natl Univ Def Technol, Coll Comp, Changsha 410073, Hunan, Peoples R China

来源：

2017 IEEE 12TH INTERNATIONAL CONFERENCE ON ASIC (ASICON) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this thesis, we investigate optimum Radiation Hardened By Design (RHBD) in the Low Pass Filter (LPF) of the all-digital Phase Interpolation Clock and Data Recovery (PICDR) for use against Single-Event Transients (SET). PICDR is a critical circuit in the receiver of high-speed multi-channel Serial-data transceiver systems. Nevertheless, in some particular operating environment, there exist severe challenges for the PICDR. A state-recoverable PICDR is investigated regarding its SET pulse immunities. This state-recoverable PICDR is designed with 65-nm CMOS technology with the Spectre simulation tool, and in consequence it shows as a successful RHBD implementation which is immune to near 90% of the function errors caused by the SET with very low penalties.

引用

页码：339 / 342

页数：4

共 50 条

[31] A novel half-rate architecture for high-speed clock and data recovery
He, QR
Feng, MT
IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2004, : 351 - 354
[32] Modeling of single-event effects in circuit-hardened high-speed SiGe HBT logic
Niu, GF
Krithivasan, R
Cressler, JD
Marshall, P
Marshall, C
Reed, R
Harame, DL
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2001, 48 (06) : 1849 - 1854
[33] High performance digital clock and data recovery circuit
College of Information Technology Science, Nankai University, Tianjin 300071, China
Guti Dianzixue Yanjiu Yu Jinzhan, 2008, 3 (435-439):
[34] Study of Single-Event Transients in High-Speed Operational Amplifiers
Jaulent, P.
Pouget, V.
Lewis, D.
Fouillat, P.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (04) : 1974 - 1981
[35] Study of Single-Event Transients in High-Speed Operational Amplifiers
Jaulent, P.
Pouget, V.
Lewis, D.
Fouillat, P.
RADECS 2007: PROCEEDINGS OF THE 9TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, 2007, : 97 - 103
[36] Digital Clock and Data Recovery Circuit Design: Challenges and Tradeoffs
Talegaonkar, Mrunmay
Inti, Rajesh
Hanumolu, Pavan Kumar
2011 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2011,
[37] Investigation on all-optical clock recovery from high-speed NRZ data
Wu, Tong
Qiu, Kun
Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China, 2004, 33 (06):
[38] A High-Speed Multiwavelength Clock Recovery Scheme for Optical Packets
Spyropoulou, M.
Pleros, N.
Papadimitriou, G.
Tomkos, I.
IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (21-24) : 2147 - 2149
[39] High-Speed Clock Recovery for Low-Cost FPGAs
Haller, Istvan
Baruch, Zoltan Francisc
2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010), 2010, : 610 - 613
[40] Single-Event Analysis and Hardening of Mixed-Signal Circuit Interfaces in High-Speed Communications Devices
Armstrong, S. E.
Blaine, R. W.
Holman, W. T.
Massengill, L. W.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2012, 59 (04) : 1027 - 1033

← 1 2 3 4 5 →