Determination of crystallite size in polished graphitized carbon by Raman spectroscopy

被引:151
作者
Maslova, O. A. [1 ,2 ]
Ammar, M. R. [1 ,2 ]
Guimbretiere, G. [1 ,2 ]
Rouzaud, J. -N. [3 ]
Simon, P. [1 ,2 ]
机构
[1] CNRS, UPR CEMHTI 3079, F-45071 Orleans 2, France
[2] Univ Orleans, Polytech Orleans, F-45072 Orleans 2, France
[3] Ecole Normale Super, Geol Lab, CNRS ENS UMR 8538, F-75231 Paris 5, France
关键词
TRANSMISSION ELECTRON-MICROSCOPY; X-RAY-DIFFRACTION; LASER RAMAN; AMORPHOUS-CARBON; GLASSY-CARBON; THIN-SECTIONS; SPECTRA; SCATTERING; FILMS; FIBERS;
D O I
10.1103/PhysRevB.86.134205
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A series of polished and unpolished sp(2)-nanostructured carbons "nanographites" obtained from the pyrolysis of various precursor types have been systematically studied by both Raman spectroscopy and x-ray diffraction. The ratio between the intensities of the disorder-induced D band and the first-order graphite G band (I-D/I-G) commonly used up to now to estimate the "crystallite" diameter L-a displays, in the case of polished graphitized sp(2) carbons, clear spatial heterogeneities and can lead to the overestimation of the intrinsic structural disorder. The full width at half maximum of the G band, which is shown to be insensitive to the polishing process, exhibits a linear dependence on the mean "crystallite" diameter [FWHM(G) = 14 + 430/L-a] and therefore can be used for an accurate structural characterization of these nanographites.
引用
收藏
页数:5
相关论文
共 39 条
  • [1] On a Reliable Structural Characterization of Polished Carbons in Meteorites by Raman Microspectroscopy
    Ammar, M. R.
    Charon, E.
    Rouzaud, J. -N.
    Aleon, J.
    Guimbretiere, G.
    Simon, P.
    [J]. SPECTROSCOPY LETTERS, 2011, 44 (7-8) : 535 - 538
  • [2] How to obtain a reliable structural characterization of polished graphitized carbons by Raman microspectroscopy
    Ammar, M. R.
    Rouzaud, J. -N.
    [J]. JOURNAL OF RAMAN SPECTROSCOPY, 2012, 43 (02) : 207 - 211
  • [3] Characterization of graphite implanted with chlorine ions using combined Raman microspectrometry and transmission electron microscopy on thin sections prepared by focused ion beam
    Ammar, M. R.
    Rouzaud, J. N.
    Vaudey, C. E.
    Toulhoat, N.
    Moncoffre, N.
    [J]. CARBON, 2010, 48 (04) : 1244 - 1251
  • [4] BARANOV AV, 1987, OPT SPEKTROSK+, V62, P1036
  • [5] Raman spectroscopy of graphitic foams
    Barros, EB
    Demir, NS
    Souza, AG
    Mendes, J
    Jorio, A
    Dresselhaus, G
    Dresselhaus, MS
    [J]. PHYSICAL REVIEW B, 2005, 71 (16):
  • [6] THE EFFECTS OF MICROCRYSTAL SIZE AND SHAPE ON THE ONE PHONON RAMAN-SPECTRA OF CRYSTALLINE SEMICONDUCTORS
    CAMPBELL, IH
    FAUCHET, PM
    [J]. SOLID STATE COMMUNICATIONS, 1986, 58 (10) : 739 - 741
  • [7] Measuring the absolute Raman cross section of nanographites as a function of laser energy and crystallite size
    Cancado, L. G.
    Jorio, A.
    Pimenta, M. A.
    [J]. PHYSICAL REVIEW B, 2007, 76 (06)
  • [8] Influence of the atomic structure on the Raman spectra of graphite edges -: art. no. 247401
    Cançado, LG
    Pimenta, MA
    Neves, BRA
    Dantas, MSS
    Jorio, A
    [J]. PHYSICAL REVIEW LETTERS, 2004, 93 (24)
  • [9] Anisotropy of the Raman spectra of nanographite ribbons -: art. no. 047403
    Cançado, LG
    Pimenta, MA
    Neves, BRA
    Medeiros-Ribeiro, G
    Enoki, T
    Kobayashi, Y
    Takai, K
    Fukui, K
    Dresselhaus, MS
    Saito, R
    Jorio, A
    [J]. PHYSICAL REVIEW LETTERS, 2004, 93 (04) : 047403 - 1
  • [10] Dresselhaus M. S., 1996, SCI FULLERENES CARBO