Influence of recoil effect and surface excitations on the inelastic mean free paths of electrons in polymers

被引：3

作者：

Lesiak, B.

Kosinski, A.

Jablonski, A.

Sulyok, A.

Gergely, G.

Toth, J.

Varga, D.

机构：

[1] Polish Acad Sci, Inst Phys Chem, PL-01224 Warsaw, Poland

[2] Hungarian Acad Sci, Inst Tech Phys & Mat Sci, H-1545 Budapest, Hungary

[3] Hungarian Acad Sci, Nucl Phys Res Inst, ATOMKI, H-4001 Debrecen, Hungary

来源：

ACTA PHYSICA POLONICA A | 2006年 / 109卷 / 06期

关键词：

D O I：

10.12693/APhysPolA.109.789

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this work, the influence of recoil effect and surface excitations on the inelastic mean free paths for polythiophenes is investigated. The inelastic mean free paths of electrons in polythiophenes are measured with the elastic peak electron spectroscopy method using the Ag standard and the electron elastic scattering cross-sections from the database NIST 3.1 in the electron kinetic energy range 200-5000 eV. The Monte Carlo model is applied for evaluating the electron backscattering intensities from the polymers and the Ag standard, as well as for evaluating electrons quasi-elastically backscattered from atoms of different atomic numbers (the recoil effect). The surface excitation corrections are accounted for using the formalism of Chen, with the material parameters for polythiophenes evaluated from the elastic peak electron spectroscopy method. Deviations due to recoil effect and surface excitations to the inelastic mean free paths are compared and discussed. Correction to the inelastic mean free paths due to recoil effect is considerable but is smaller, however, than the correction due to surface excitations. Accounting for recoil effect and surface excitations leads to improvement of the inelastic mean free paths, as compared to the inelastic mean free paths resulting from the predictive formulae of Gries.

引用

页码：789 / 800

页数：12

共 43 条

[11] Dependence of experimentally determined inelastic mean free paths of electrons on the measurement geometry
Jablonski, A
Jiricek, P
[J]. SURFACE SCIENCE, 1998, 412-13 : 42 - 54
[12] Determination of the electron inelastic mean free path in solids from the elastic electron backscattering intensity
Jablonski, A
[J]. SURFACE AND INTERFACE ANALYSIS, 2005, 37 (11) : 1035 - 1044
[13] JABLONSKI A, 1992, SURF SCI REP, V47, P33
[14] JABLONSKI A, 2003, NIST ELECT ELASTIC S
[15] Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
Jiricek, P
Zemek, J
Lejcek, P
Lesiak, B
Jablonski, A
Ceransky, M
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2002, 20 (02): : 447 - 455
[16] SOME APPLICATIONS OF HIGH-ENERGY, HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY USING BREMSSTRAHLUNG RADIATION
KOVER, L
VARGA, D
CSERNY, I
TOTH, J
TOKESI, K
[J]. SURFACE AND INTERFACE ANALYSIS, 1992, 19 (1-12) : 9 - 15
[17] REASSESSMENT OF ENERGY TRANSFERS IN THE QUASI-ELASTIC SCATTERING OF 250-3000 EV ELECTRONS AT SURFACES
LASER, D
SEAH, MP
[J]. PHYSICAL REVIEW B, 1993, 47 (15): : 9836 - 9839
[18] Influence of surface composition and density on electron inelastic mean free paths in Ge
Lesiak, B
Jablonski, A
Zemek, J
Jiricek, P
Pavluch, J
[J]. SURFACE AND INTERFACE ANALYSIS, 2002, 33 (05) : 381 - 393
[19] Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method
Lesiak, B
Kosinski, A
Jablonski, A
Kövér, L
Tóth, J
Varga, D
Cserny, I
Zagorska, M
Kulszewicz-Bajer, I
Gergely, G
[J]. APPLIED SURFACE SCIENCE, 2001, 174 (01) : 70 - 85
[20] Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers
Lesiak, B
Kosinski, A
Krawczyk, M
Zommer, L
Jablonski, A
Zemek, J
Jiricek, P
Kövér, L
Tóth, J
Varga, D
Cserny, I
[J]. APPLIED SURFACE SCIENCE, 1999, 144-45 : 168 - 172

← 1 2 3 4 5 →