Symbolic Moment Computation for Statistical Analysis of Large Interconnect Networks

被引:4
作者
Hao, Zhigang [1 ]
Shi, Guoyong [1 ]
Tan, Sheldon X. -D. [2 ]
Tlelo-Cuautle, Esteban [3 ]
机构
[1] Shanghai Jiao Tong Univ, Sch Microelect, Shanghai 200240, Peoples R China
[2] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA
[3] INAOE, Tonantzintla 72840, Mexico
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
Binary decision diagram (BDD); clock mesh; incremental analysis; moment sensitivity; process variations; statistical analysis; symbolic moment; MODEL ORDER REDUCTION; SENSITIVITY CALCULATION; MATCHING MODEL; DELAY; METRICS; CIRCUITS;
D O I
10.1109/TVLSI.2012.2197835
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The shrinking technology feature size and dense large-scale integration make process variation a challenging issue directly confronting the latest design automation tools. Process variation causes severe variation in interconnect networks, including very large-scale integrated interconnect structures, such as clock trees, clock mesh, power-ground networks, and other wiring structures in 3-D integrated circuits. The traditional moment computation techniques are only partly useful for analyzing such variational problems, however, their computational efficiency cannot meet the quickly rising needs, such as statistical analysis. This paper presents a novel symbolic moment calculator (SMC) for variational interconnect analysis. The moment calculator is constructed in a regular data structure that incorporates binary decision diagrams for data storage and computation. Given an interconnect circuit, such a computation diagram has to be constructed only once and can be repeatedly invoked for computation of moments with varying parameter values. Also, the SMC is friendly to interconnect synthesis in that it can be incrementally modified according to the modifications made to the circuit structure. Applications of the SMC for fast moment computation, sensitivity analysis, and statistical timing analysis are addressed. Significant efficiency is demonstrated comparing to other existing methods.
引用
收藏
页码:944 / 957
页数:14
相关论文
共 45 条
[1]   A simple metric for slew rate of RC circuits based on two circuit moments [J].
Agarwal, K ;
Sylvester, D ;
Blaauw, D .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2004, 23 (09) :1346-1354
[2]   Statistical interconnect metrics for physical-design optimization [J].
Agarwal, Kanak ;
Agarwal, Mridul ;
Sylvester, Dennis ;
Blaauw, David .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, 25 (07) :1273-1288
[3]  
AKERS SB, 1978, IEEE T COMPUT, V27, P509, DOI 10.1109/TC.1978.1675141
[4]   RC delay metrics for performance optimization [J].
Alpert, CJ ;
Devgan, A ;
Kashyap, CV .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2001, 20 (05) :571-582
[5]  
[Anonymous], 2008, Nangate 45 nm open cell library
[6]  
[Anonymous], 2005, PREDICTIVE TECHNOLOG
[7]   Early probabilistic noise estimation for capacitively coupled interconnects [J].
Becer, MR ;
Blaauw, D ;
Panda, R ;
Hajj, IN .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (03) :337-345
[8]  
BRYANT RE, 1986, IEEE T COMPUT, V35, P677, DOI 10.1109/TC.1986.1676819
[9]   A sliding window scheme for accurate clock mesh analysis [J].
Chen, H ;
Yeh, C ;
Wilke, G ;
Reddy, S ;
Nguyen, H ;
Walker, W ;
Murgai, R .
ICCAD-2005: INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, DIGEST OF TECHNICAL PAPERS, 2005, :939-946
[10]   Closed-form crosstalk noise metrics for physical design applications [J].
Chen, LH ;
Marek-Sadowska, M .
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS, 2002, :812-819