Improved spatial resolution in magnetic force microscopy

被引：64
作者：
Skidmore, GD
DanDahlberg, E
机构：
[1] Magnetic Microscopy Center, School of Physics and Astronomy, University of Minnesota, Minneapolis
来源：
APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 22期
关键词：
D O I：
10.1063/1.120316
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Electron beam deposited spikes for use in magnetic force microscopy have been grown onto atomic force microscope tips and coated with magnetic thin films using thermal evaporation. The resulting magnetically active regions are a close approximation to monopoles or dipoles located on the very end of the spikes. We show that these tips image with increased spatial resolution and less sample perturbation than the standard, commercially available tips. (C) 1997 American Institute of Physics.
引用
收藏
页码：3293 / 3295
页数：3
相关论文
共 50 条
  • [31] Deconvolution processing for increasing the resolution of magnetic force microscopy measurements
    Candocia, FM
    Svedberg, EB
    Litvinov, D
    Khizroev, S
    [J]. NANOTECHNOLOGY, 2004, 15 (10) : S575 - S584
  • [32] Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
    Parker, Audrey C.
    Maryon, Olivia O.
    Kaffash, Mojtaba T.
    Jungfleisch, M. Benjamin
    Davis, Paul H.
    [J]. JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2022, (185):
  • [33] Spatial resolution, information limit, and contrast transfer in piezoresponse force microscopy
    Kalinin, S. V.
    Jesse, S.
    Rodriguez, B. J.
    Shin, J.
    Baddorf, A. P.
    Lee, H. N.
    Borisevich, A.
    Pennycook, S. J.
    [J]. NANOTECHNOLOGY, 2006, 17 (14) : 3400 - 3411
  • [34] High spatial resolution Kelvin probe force microscopy with coaxial probes
    Brown, Keith A.
    Satzinger, Kevin J.
    Westervelt, Robert M.
    [J]. NANOTECHNOLOGY, 2012, 23 (11)
  • [35] Improved atomic force microscopy resolution using an electric double layer
    Sokolov, IY
    Henderson, GS
    Wicks, FJ
    Ozin, GA
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (07) : 844 - 846
  • [36] Improved resolution of magnetic resonance microscopy in examination of skin tumors
    elGammal, S
    Hartwig, R
    Aygen, S
    Bauermann, T
    elGammal, C
    Altmeyer, P
    [J]. JOURNAL OF INVESTIGATIVE DERMATOLOGY, 1996, 106 (06) : 1287 - 1292
  • [37] Effect of Magnetic Film Thickness on the Spatial Resolution of Magnetic Force Microscope Tips
    Nagano, Katsumasa
    Tobari, Kousuke
    Ohtake, Mitsuru
    Futamoto, Masaaki
    [J]. JOINT EUROPEAN MAGNETIC SYMPOSIA (JEMS), 2011, 303
  • [38] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY
    MARTIN, Y
    RUGAR, D
    WICKRAMASINGHE, HK
    [J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 244 - 246
  • [39] Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution
    Belova, L. M.
    Hellwig, Olav
    Dobisz, Elizabeth
    Dahlberg, E. Dan
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (09)
  • [40] Specialized probes with nanowhisker structures for high resolution magnetic force microscopy
    Zhukov, M. V.
    Belousov, K. I.
    Mozharov, A. M.
    Mukhin, I. S.
    Golubok, A. O.
    [J]. 2ND INTERNATIONAL SCHOOL AND CONFERENCE SAINT-PETERSBURG OPEN ON OPTOELECTRONICS, PHOTONICS, ENGINEERING AND NANOSTRUCTURES (SPBOPEN2015), 2015, 643
12345