Improved spatial resolution in magnetic force microscopy

被引：64

作者：

Skidmore, GD

DanDahlberg, E

机构：

[1] Magnetic Microscopy Center, School of Physics and Astronomy, University of Minnesota, Minneapolis

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 22期

关键词：

D O I：

10.1063/1.120316

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron beam deposited spikes for use in magnetic force microscopy have been grown onto atomic force microscope tips and coated with magnetic thin films using thermal evaporation. The resulting magnetically active regions are a close approximation to monopoles or dipoles located on the very end of the spikes. We show that these tips image with increased spatial resolution and less sample perturbation than the standard, commercially available tips. (C) 1997 American Institute of Physics.

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收藏

页码：3293 / 3295

页数：3

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