Simulation of the thin-film thickness distribution for an OLED thermal evaporation process

被引:28
|
作者
Lee, Eungki [1 ]
机构
[1] Kongju Natl Univ, Div Mech & Automot Engn, Cheonan, Chungnam, South Korea
关键词
OLED (organic light-emitting device); Vacuum thermal evaporation; Thin film; Thickness; Uniformity; LAYER; UNIFORMITY;
D O I
10.1016/j.vacuum.2008.08.007
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A design of an OLED (organic light-emitting device) fabrication system strongly depends on a thermal evaporation process. In an OLED evaporation process, the essential requirements include good uniformity of the film thickness over a glass substrate. In this paper, a process simulation model was developed to predict the film thickness distribution by understanding system design parameters that affect the uniformity of film thickness. Based on the method developed in this study, the uniformity of the thickness in an organic layer was successfully controlled. The developed method allowed the manufacture of high quality OLED displays. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:848 / 852
页数:5
相关论文
共 50 条
  • [1] Simulation of organic thin-film growth for thermal evaporation process
    Hu, Chen
    Yang, Gang
    Chen, Wen-Bin
    Luo, Kai-Jun
    Gongneng Cailiao/Journal of Functional Materials, 2010, 41 (SUPPL. 3): : 435 - 437
  • [2] Simulation of thin film thickness distribution for thermal evaporation process using a scanning linear source
    Kim, Min-Gab
    Pahk, Heui-Jae
    JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2017, 25 (04) : 249 - 257
  • [3] Simulation of the organic thin film thickness distribution for multi-source thermal evaporation process
    Hu Chen
    Yang Gang
    Chen Wenbin
    Luo Kaijun
    Liu Feng
    VACUUM, 2010, 85 (03) : 448 - 451
  • [4] THICKNESS DISTRIBUTION IN THIN-FILM
    HATTORI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (04) : 635 - 636
  • [5] Analytical Solutions of Heat Transfer and Film Thickness in Thin-Film Evaporation
    Yan, Chunji
    Ma, H. B.
    JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME, 2013, 135 (03):
  • [6] THIN-FILM THICKNESS MEASUREMENTS WITH THERMAL WAVES
    ROSENCWAIG, A
    OPSAL, J
    WILLENBORG, DL
    JOURNAL DE PHYSIQUE, 1983, 44 (NC-6): : 483 - 489
  • [7] THIN-FILM THICKNESS MEASUREMENTS WITH THERMAL WAVES
    ROSENCWAIG, A
    OPSAL, J
    WILLENBORG, DL
    APPLIED PHYSICS LETTERS, 1983, 43 (02) : 166 - 168
  • [8] Hotspot Thermal Management via Thin-Film Evaporation
    Adera, Solomon
    Antao, Dion
    Raj, Rishi
    Wang, Evelyn N.
    2016 15TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM), 2016, : 364 - 371
  • [9] THERMAL-WAVE MEASUREMENT OF THIN-FILM THICKNESS
    ROSENCWAIG, A
    ACS SYMPOSIUM SERIES, 1986, 295 : 181 - 191
  • [10] EVAPORATION - THINK THIN-FILM
    SCHURTER, RV
    CHEMICAL ENGINEERING, 1994, 101 (04) : 104 - 106